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Electronic Measurement

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Low Current Measurement Technologies in Agilent 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

Application Note 2011-02-08

PDF PDF 1.47 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Agilent 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

Application Note 2011-02-08

PDF PDF 1.61 MB
High Speed Parametric Test using Agilent 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Agilent 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
A Complete Solution for Evaluating Write/Erase Characteristics of Flash Memory Cells
This application note describes how to use the Agilent 4082F Flash Memory Cell Test System and its high-voltage semiconductor pulse generator units to characterize state-of-the-art flash memory technologies such as MLC and high-density NAND flash.

Application Note 2008-01-23