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Electronic Measurement

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PXI and AXIe Modular Products Catalog September 2013
Agilent PXI Modular Instrument catalog - contains measurement modules and companion software optimized for testing applications that require high-performance, speed, and throughput.

Catalog 2013-09-03

PDF PDF 5.28 MB
Model D20 Digital Functional Test System - Service Manual
This manual shows how to service the Agilent 75000 Series C Model D20 Digital Functional Test System (Model D20).

Service Manual 2012-09-01

PDF PDF 3.27 MB
E1450A 160 MHz Timing Module - Hardware Manual
This manual provides general module information and tasks you must perform to install and prepare your module.

User Manual 2012-09-01

PDF PDF 885 KB
Pulse Pattern and Function Arbitrary Generators and Arbitrary Waveform Generator - Brochure
This Agilent family of pulse/pattern generators can help you verify and characterize digital or analog systems, products, and components.

Brochure 2012-01-27

PDF PDF 1.48 MB
Declaration of Conformity
Search Agilent Regulatory database for most recent Declaration of Conformity statement for your product.

Help File 2010-10-15

Discover the Alternatives in Automated Measurements and Testing - Brochure
Discover the Alternatives in Automated Measurements and Testing

Brochure 2010-08-17

PDF PDF 1.79 MB
81100 Family Pulse/Pattern Generator - Data Sheet
81100 Family Pulse/Pattern Generator Technical Specifications

Data Sheet 2009-11-24

Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) - Application Note
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...

Application Note 2006-12-12

PDF PDF 382 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
Consolidated Automated Support System (CASS) - Case Study
Electronic Functional Test of the Consolidated Automated Support System (CASS)

Case Study 2004-07-29

PDF PDF 232 KB
E8311A/12A Data Sheet

Data Sheet 2004-04-28

Pulse Parameter Definitions - Application Note
Definitions of Terms used with Pulse/Pattern/Data Generators

Application Note 2002-04-08

E8311A / E8312A Quick Start Guide (Apr00)
The E8311/12A 165/330 MHz Pulse and Pattern Generators Quick Start Guide helps you to quickly familiarize yourself with the features and the user interface of the Agilent E8311A/12A instruments.

Quick Start Guide 2001-11-14

E8311A / E8312A Quick Start Guide, Manual Changes (May01)
This is the latest Manual Changes for the E8311A/E8312A Quick Start Guide.

Quick Start Guide 2001-11-14

E8312A Performance Tests (Aug01)
These tests help you to check that the Agilent E8312A 330 MHz VXI Pulse/Pattern Generator is working correctly

Calibration Guide 2001-11-14

E8311A Performance Tests (Aug01)
Agilent E8311A Performance Test, English

Calibration Guide 2001-11-14

E8311A / E8312A Installation Guide (Apr00)
This installation guide helps you mainly to install the E8311A / E8312A into a VXI mainframe.

Installation Manual 2001-11-06

Transition-time Converters - Application Note
The Agilent 15432B, 15433B, 15434B, 15435A, and 15438A are converters that have been designed to convert

Application Note 2001-03-27

Adder/Splitter/Inverter - Application Note
Agilent Adder/Splitter/Inverter

Application Note 2001-03-26

Environmental Test of Automotive Radio and Engine Controllers (AN 1270-11)
Automotive components such as radios and engine controllers are tested to environmental limits using HP Automatic Test Systems to control the environmental chamber and test the components therein. See Application Note 1270-11 attached to this page for more information.

Application Note 1995-06-01

PDF PDF 108 KB
HP 75000 Model D20 Digital Functional Test System
The Agilent 75000 Model D20 Digital Functional Test System is designed for functional testing of digital devices in manufacturing where high test throughput and low cost-per-channel are required. This Product Note contains major sections on hardware, software, mixed signal testing, handshaking...

Application Note 1991-08-01

PDF PDF 1.46 MB