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Find by Product Model Number: Examples: 34401A, E4440A

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The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer.

Application Note 2013-07-24

Achieve Accurate Resistance Measurements with the Agilent 34980A Multifunction Switch Measure Unite
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Agilent 34980A

Application Note 2013-07-10

Make Better RMS Measurements with Your DMM - Application Note
Different techniques that DMMs use to measure rms values, signal affects the quality of measurements, how to avoid common measurement mistakes.

Application Note 2013-06-10

Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit

Application Note 2013-01-31

34980A Measurements Made Easy
This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software.

Application Note 2012-12-26

Comparing the Agilent 34980A and PXI for Switch Measurement Applications
This application note provides a comparison between PXI cardcage solutions and a combined system, the Agilent 34980A switch/measure unit, so you can determine which platform best meets your needs for electronic functional test and data acquisition.

Application Note 2012-04-27

Making Good Thermocouple Measurements
This application note provides tips for optimizing thermocouple measurements in a noisy environment.

Application Note 2012-01-26

Practical Temperature Measurements (AN-290)
The purpose of this application note is to explore the more common temperature measurement techniques, and introduce procedures for improving their accuracy.

Application Note 2012-01-26

Selecting the Correct Temperature Sensor for Your Application
This application note provides tips for selecting the correct temperature sensor.

Application Note 2012-01-25

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

Application Note 2011-11-29

Making High-Accuracy Temperature Measurements with the 34970A/34972A Data Acquisition Switch Unit
This application note explains how to wire the VTI Instruments VT1586A rack-mount panel and use it to make high-accuracy temperature measurements with a 34970A, 34972A and 34901A 20-channel multiplexer module.

Application Note 2011-01-10

Switching Solutions
This paper discusses Agilent's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

Migrating your Application Software from the 34970A to the 34972A
This white paper discusses how to migrate from existing applications that use the 34970A to the new 34972A Data Acquisition/Switch Unit.

Application Note 2010-01-29

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2009-12-02

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

Creating Arbitrary Waveforms in the U2300A Series and U2500A Series Data Acquisition Devices
This application note covers the inner workings of how waveforms and arbitrary waveforms are formed.

Application Note 2009-08-01

Using the U2331A USB DAQ in the construction industry
The device can be used to measure various types of parameters in the construction industry.

Application Note 2009-04-06

Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment
Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment.

Application Note 2009-03-04

DC-to-DC Regulator Auto Evaluation Test with the U2351A
The Agilent U2351A data acquisition (DAQ) is used as an automatic DC voltage regulator and to induce voltage into the electronics system thereby causing an amount of under voltage or over voltage stress to the device under test (DUT).

Application Note 2009-02-04

Simplified PC Connections for GPIB Instruments (AN 1409-1) - Application Note
Making the connection from your instruments to your PC has not always been an easy task. Today there are new choices that allow for easier connections so that you can focus on your measurement tasks and not on your connections. This paper will walk you through the choices you need to make when...

Application Note 2009-01-22

High-Speed Scanning with the Agilent 34980A Multifunction Switch/Measure Mainframe and Modules
This application note explores components that affect the speed in a system. It also gives a breakdown of each component with SCPI language examples of how to set up the instrument for fast measurements that best fit your specific application.

Application Note 2008-11-26

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