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Used 3070/i3070 ICT

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Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Agilent!
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Agilent!

Promotional Materials 2012-11-07

3070/i3070 DUT Power Supply Document Library
This document library contains the installation manual, programming guide and operating guide/manual of the various models of DUT power supply that are supported on the Agilent 3070/i3070 ICT systems.

User Manual 2012-01-25

Test Coverage Consultant - Data Sheet
The Agilent Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Agilent Test Coverage Consultant Agilent Medalist i3070 Series 5

Data Sheet 2011-07-14

PDF PDF 214 KB
How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2011-06-23

PDF PDF 150 KB
TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Agilent Test Coverage Consultant up and running on your PC quickly.

Technical Overview 2010-11-17

PDF PDF 242 KB
Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

PDF PDF 175 KB
Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Agilent Medalist i3070 in-circuit test solution.

Application Note 2010-04-01

PDF PDF 207 KB
Removing Boundaries Out of Limited Access Testing
In-circuit test was once considered off-limits to PCBAs with limited test access. That boundary is disappearing with the help of new ICT technologies. This paper is reprinted with kind permission from EM Asia Magazine.

Article 2010-01-15

PDF PDF 611 KB
Testing Bridges to Nowhere-Combining Boundary Scan and Capacitive Sensing
This paper describes existing limitations of the 1149.1 boundary scan techniques, IC design changes that would address these limitations and some experimental results. Reprinted with permission from IEEE.

Application Note 2010-01-06

PDF PDF 455 KB
An Outlier Detection Based Approach for PCB Testing
This paper discusses enhancements to the capacitative leadframe testing technique, more commonly known as the Agilent patented VTEP technology. Reprinted with permission from IEEE.

Application Note 2010-01-06

PDF PDF 1004 KB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series
Agilent's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2009-12-02

PDF PDF 332 KB
Vectorless Test Solutions --An analysis of performance differences between VTEP
This white paper provides an analysis of performance differences between Agilent VTEP, FrameScan FX and TestJet Enhanced technologies.

Application Note 2009-11-03

PDF PDF 214 KB
Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

Feature Story 2009-09-10

PDF PDF 111 KB
In-Circuit Test Press Releases

Press Materials 2009-08-07

Overcoming Limited Access with Cover-Extend Technology at In-Circuit Test
This case study illustrates how Agilent's Cover-Extend Technology can help to enable test access for situations where test access becomes increasingly limited with usage of high complexity components on computer motherboards.

Case Study 2009-07-22

PDF PDF 149 KB
Introduction to i3070
See the exciting features available on the Agilent Medalist i3070 07.00p. Click the link above to view a Flash Presentation on the i3070 In-Circuit Tester.

Demo 2009-06-25

ZIP ZIP 35.84 KB
Network Parameter Measurement: Best Practices using the Agilent Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
In-Circuit Test Channel Partner Interview Series: Everett Charles Technology
The channel partners series began with an exploration of programming houses. It is not that we venture into the Fixture house side of the business. Please enjoy this extension of the article series.

Feature Story 2009-03-10

PDF PDF 94 KB
Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Agilent Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

PDF PDF 342 KB
Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
In-Circuit Test Channel Partner Interview Series: QXQ, Inc.
This article is continues to educate on fixture houses in relation to in-circuit test as the article series explores fixturing houses that Agilent works regularly with. This article features QXQ, Inc.

Feature Story 2009-03-04

PDF PDF 94 KB
In-Circuit Test Channel Partner Interview Series: TestingHouse Inc.
his article is the fourth in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features TestingHouse Inc., from a programming house perspective.

Feature Story 2009-03-03

PDF PDF 95 KB
In-Circuit Test Channel Partner Interview Series: Circuit Check, Inc.
Circuit Check, Inc. provides comment in the editorial series serving to educate our in-circuit test contacts about the variety of fixture houses that Agilent has partnerships with.

Feature Story 2009-02-28

PDF PDF 91 KB

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