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Device Modeling and Characterization

Find by Product Model Number: Examples: 34401A, E4440A

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MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Seminar Materials 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

IC-CAP User Training
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA
Originally broadcast April 19, 2011

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

New Wide Band Gap High-Power Semiconductor Measurement Techniques Webcast
Live broadcast July 31, 2013; 11am PT/2pm ET

Webcast

Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012

Webcast - recorded

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

Agilent EEsof MMIC Design Symposium - Tuesday 8th November 2011
Agilent EEsof MMIC Design Symposium

Seminar

International Microwave Symposium (IMS) 2014
June 1-16, 2014; Tampa Bay, Florida

Tradeshow

Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters
Original broadcast Mar 27, 2012

Webcast - recorded

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

Webcast - recorded

Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

Breakthrough in High Speed Interconnect Analysis and Compliance Testing
Originally broadcast April 27, 2011

Webcast - recorded

Fundamentals of Semiconductor Capacitance Measurement Webcast
Original broadcast October 29, 2013

Webcast - recorded

Optimizing PXI Modular Functional Test System Throughput Webcast
Originally broadcast April 27, 2011

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Eventi di Agilent Italia
Benvenuti nella pagina degli eventi di Agilent Italia

Seminar

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

Webcast - recorded

Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - recorded

PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation
Originally broadcast Feb 10, 2011

Webcast - recorded

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded