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N4915A-014 PCI Express 3.0® Calibration Channels
The N4815A-014 PCI Express 3.0 calibration channels allow to generate receiver stress conditions according to PCIe 3.0 base specification rev 1.0 when used together with J-BERT N4903B and N4916B.

Data Sheet 2011-07-05

Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

Eight Hints for Better Scope Probing
Probing is critical to making quality oscilloscope measurements, and often the probe is the fi rst link in the oscilloscope measurement chain.

Application Note 2011-05-24

Optimizing Oscilloscope Measurement Accuracy on High-Performance Systems with Agilent Active...
To keep high-speed devices supplied with data so they are not sitting idle, designers have been inventing techniques to increase the bandwidth of external buses in order to move large amounts of data between devices on circuit boards.

Application Note 2011-05-20

86100D - Lowest Cost of Optical Transceiver Test
Explore major cost of test reduction ideas using the Eye Mask Hit Ratio Technique and the Auto Mask Margin function. Achieve dramatic efficiency improvement in optical transmitter eye-mask testing.

How-To Video 2011-05-05

86100 Infiniium DCA Online Help Archive
The Infiniium DCA Online Help contains information you need to use your DCA. This includes theory of operation, step-by-step procedures for many common tasks, a complete glossary and much more.

Help File 2011-04-20

N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Data Sheet 2011-04-13

PDF PDF 3.07 MB
N4876A 28 Gb/s Multiplexer 2:1, Data Sheet
The N4876A 28Gb/s multiplexer allows to extend the generator data rate of the J-BERT N4903B and ParBERT81250A up to 28.4 Gb/s. Design and test engineers in the semiconductor, communications, storage and computer industry can now accurately characterize the next generation of serial interfaces operating at bitrates of up to 28.4 Gb/s. With its excellent output performance it helps to optimize design margins by minimizing the influence of the test equipment on measurement results.

Data Sheet 2011-03-17

PDF PDF 1.39 MB
86105D Broad Wavelength Plug-in Module for High-Speed Optical Transceive
The 86105D is the ideal solution for waveform analysis of transceivers operating at 8.5 Gb/s (8X Fibre Channel), 9.953 Gb/s (OC-192/STM- 64), 10.3125 Gb/s (10 Gb Ethernet), 10.52 Gb/s (10X Fibre Channel), and 14.025 Gb/s (16X Fibre Channel) rates.

Brochure 2011-01-27

PDF PDF 134 KB
86115D Multi-port Plug-in Module for High-volume/Parallel Transceiver
The 86115D is the ideal solution for high volume waveform analysis of transceivers operating, they Dramatically reduce the cost of test with high throughput test configurations

Data Sheet 2011-01-26

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2011-01-11

N4876A 28 Gb/s Multiplexer Getting Started Guide for setups with ParBERT

Quick Start Guide 2010-12-20

PDF PDF 661 KB
PXIT 10.3125 Gb/s Pattern Generator N2102B and PXIT Synthesizer N2099A Data Sheet
The N2102B PXIT Pattern Generator is a 2-slot PXI module capable of generating a number of industry standard patterns with very low jitter, from 622 Mb/s to 11.1 Gb/s. The N2099A PXIT Synthesizer is a 2-slot PXI module with dual RF outputs, tunable over a 2 GHz range.

Data Sheet 2010-09-20

PDF PDF 2.54 MB
Error Detection Up to 28.4 Gb/s During Receiver Test with the Agilent J-BERT
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.

Application Note 2010-09-16

86100C Option 201 86100D Option 201 Advanced Waveform Analysis Software
Agilent 86100C Option 201 Advanced Waveform Analysis Software. Option 201 offers breakthrough insights and faster standard compliance measurements such as Transmitter Waveform Dispersion Penalty (TWDP)

Data Sheet 2010-09-10

PDF PDF 192 KB
86100CU-400 86100DU-400 PLL and Jitter Spectrum Measurement Software
Option 400 for the 86100C/D Infiniium Digital Communication Analyzer (DCA) is an advanced software application that makes fast, accurate, and repeatable phase locked loop (PLL)/jitter transfer measurements.

Data Sheet 2010-09-10

Discover the Alternatives in Automated Measurements and Testing
Discover the Alternatives in Automated Measurements and Testing

Brochure 2010-08-17

PDF PDF 1.79 MB
86100A/B/C/D Infiniium DCA Programmer's Guide

Programming and Syntax Guide 2010-08-01

PDF PDF 4.27 MB
N2100B PXIT Digital Communications Analyzer Module User's Guide
N2100B PXIT Digital Communications Analyzer Module User's Guide

User Manual 2010-08-01

PDF PDF 2.92 MB
N4876A 28 Gb/s Multiplexer User Guide
Revision 1.0 (Released with N4876A Software 1.0.0.7).

User Manual 2010-06-24

PDF PDF 1.25 MB
86100D DCA-X Overview
This 5 minute video provides an overview of the 86100D DCA-X wide-bandwidth oscilloscope.

Product Tour 2010-06-16

WMF WMF 12.74 MB
DCA Selection and Configuration Guide

Selection Guide 2010-06-09

N1010A De-Embedding Software
N1010A FlexDCA Remote Access Software provides oscilloscope, eye/mask and jitter mode measurement capabilities on your PC.

Data Sheet 2010-06-04

PDF PDF 247 KB
86100DU-401 Advanced EYE Analysis Software
Provides a simple and accurate solution to the challenging process of measuring jitter on very long patterns and performs precision mask testing using BER contours

Data Sheet 2010-06-04

N1020A TDR Probe Product Overview
The Agilent N1020A TDR Probe is a useful accessory when making time domain reflectometry measurements on printed circuit boards.

Data Sheet 2010-06-03

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