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The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

應用手冊 2013-09-10

使用Agilent B1500A 量測 CNT FET 及 CNT SET
The Agilent B1500A Semiconductor Device Analyzer has added benefits not found in the 4155C and 4156C.

應用手冊 2011-02-14

Low Current Measurement Technologies in Agilent 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

應用手冊 2011-02-08

PDF PDF 1.47 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Agilent 4080 series parametric test systems to make these measurements.

應用手冊 2011-02-08

PDF PDF 3.57 MB
Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

應用手冊 2011-02-08

PDF PDF 1.61 MB
High Speed Parametric Test using Agilent 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Agilent 4080 series parametric test systems.

應用手冊 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

應用手冊 2011-02-06

PDF PDF 331 KB
AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

應用手冊 2010-04-02

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

應用手冊 2008-12-10

電視與影像解決方案
電視與影像解決方案

應用手冊 2008-10-07

Signal Reception and A/V Functionalities Test
This application guide describe how TV manufacturer measures TV’s ability to tune to radio frequency (RF), TV signal inputting from the RF coaxial input (ANT IN) and direct video and audio input.

應用手冊 2008-09-01

PDF PDF 441 KB
Television Power Consumption Testing Application Note
This application notes explains how U8101A is being used in the TV power consumption testing.

應用手冊 2008-08-12

PDF PDF 168 KB
A Complete Solution for Evaluating Write/Erase Characteristics of Flash Memory Cells
This application note describes how to use the Agilent 4082F Flash Memory Cell Test System and its high-voltage semiconductor pulse generator units to characterize state-of-the-art flash memory technologies such as MLC and high-density NAND flash.

應用手冊 2008-01-23

Technical Overview :Technique for Controlling Agilent External DC Power Supply
Technique for Controlling Agilent External DC Power Supply From SMU to expand SMU output power capability.

應用手冊 2006-08-01

PDF PDF 1.01 MB
AN B1500A-3 IV and CV Measurement Using the Agilent B1500A MFCMU and SCUU
This application note describes how to make current-voltage and capacitance-voltage measurements using the B1500A multifrequency capacitance measurement unit and SMU CMU unify unit.

應用手冊 2005-08-01

High Speed Parametric Test using Agilent 4070 series. AN4070-6
This application note describes practical know-how and techniques to improve the throughput of the Agilent 4070 series tester.

應用手冊 2003-09-24

Adapting Agilent 4070 series to open/short Measurement of YIELD TEST CHIP. AN4070-5
This application note describes the techniques required for adapting the Agilent 4070 series to quick yield ramp-up using Yield Test Chip testing.

應用手冊 2003-09-05

High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Agilent E5270A and ENA series RF Network Analyzer.

應用手冊 2003-08-10

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

應用手冊 2003-06-26

Tips for Reusing Existing 4142B Program for Agilent E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

應用手冊 2003-05-10

PDF PDF 310 KB
Wafer Level Reliability Solution
The Agilent E5270A combines with the Agilent E5250A Low Leakage Switch Mainframe and Agilent E5255A Multiplexer Modules to form a complete wafer-level reliability (WLR) testing solution.

應用手冊 2003-02-27

What are the CV measurement capabilities of the 4140B, 4280A, and 4284A?
What are the CV measurement capabilities of the 4140B, 4280A, and 4284A?

應用手冊 2002-12-18

HTML HTML 6 KB
How Do I Connect a Centronics (Parallel Port) Printer to My Agilent 4155A or Agilent 4156A?
How Do I Connect a Centronics (Parallel Port) Printer to My Agilent 4155A or Agilent 4156A?

應用手冊 2002-12-18

HTML HTML 23 KB
How do I find my Agilent 4155A B or Agilent 4156A B firmware revision?
Click the following link for details.

應用手冊 2002-12-18

PDF PDF 19 KB
How do I connect the Agilent 4155A B or Agilent 4156A B to coaxial probes?
How do I connect the Agilent 4155A B or Agilent 4156A B to coaxial probes?

應用手冊 2002-12-18

PDF PDF 23 KB

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