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Parametric Test Systems

Find by Product Model Number: Examples: 34401A, E4440A

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The parametric Measurement Handbook
This handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2014-01-22

Parametric Instrument Accessories Guide
This document provides comprehensive and detailed information on the accessories that are available for Agilent parametric measurement instruments.

Selection Guide 2013-12-09

Agilent Pulsed-IV Parametric Test Solution - Selection Guide
This Pulsed-IV selection guide provides an overview and side-by-side comparison of all of Agilent's pulsed-IV parametric test solutions to determine the best solution to meet your unique needs.

Selection Guide 2013-12-04

EasyEXPERT Online Help
Online help file for EasyEXPERT and Desktop EasyEXPERT software

Help File 2013-10-31

HTML HTML 4.04 MB
B1500A Semiconductor Device Analyzer - Data Sheet
The Agilent B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements. Its familiar MS Windows user interface supports Agilent's new EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Agilent B1500A can be used for a wide range of semiconductor device characterization needs.

Data Sheet 2013-10-29

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

EasyEXPERT Software User's Guide Vol. 2
Provides the reference information of Agilent EasyEXPERT software.

User Manual 2013-06-30

EasyEXPERT Software User's Guide Vol. 1
Provides the reference information of Agilent EasyEXPERT software.

User Manual 2013-06-30

EasyEXPERT Software Application Library Reference
Provides a detailed description of the application tests furnished with Agilent EasyEXPERT and Desktop EasyEXPERT

Reference Guide 2013-06-30

EasyEXPERT Software Self-paced Training Manual
Self-paced training manual for EasyEXPERT Software.

User Manual 2012-11-01

PDF PDF 23 MB
B1542A Pulsed IV Package User's Guide
Covers operation, installation, and reference information of Pulsed IV Package for B1500A/EasyEXPERT.

User Manual 2012-02-01

PDF PDF 4.16 MB
Agilent 4082F Flash Memory Cell Parametric Test System
This 22-page data sheet details the features, capabilities and specifications of the Agilent 4082F Flash Memory Cell Parametric Test System.

Data Sheet 2011-12-19

PDF PDF 620 KB
Agilent 4082A Parametric Test System
The 4082A Parametric Test System is designed to perform fast and precise DC measurements, capacitance measurements, and other high frequency applications such as ring oscillator measurements.

Data Sheet 2011-11-11

PDF PDF 854 KB
B2200A/B2201A Switching Matrix User's Guide
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.

User Manual 2011-08-01

E5250A Switching Matrix User's Guide
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

User Manual 2011-08-01

Low Current Measurement Technologies in Agilent 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

Application Note 2011-02-08

PDF PDF 1.47 MB
Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

Application Note 2011-02-08

PDF PDF 1.61 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Agilent 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
High Speed Parametric Test using Agilent 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Agilent 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

Application Note 2010-04-02

4155C/4156C Semiconductor Parameter Analyzer User's Guide 1
Covers product introduction, installation, LAN connection, file operation, print/plot function, etc.

User Manual 2009-07-01

41000 Series Integrated Parametric Analysis & Characterization Environment Administration Guide
Describes the specifications, installation, operation, and service information of the 41000 series, Agilent iPACE.

User Manual 2009-07-01

Obsoleted Array Test Products
Specifications are not available from this site.

Technical Overview 2009-05-07

TXT TXT 1 KB
Obsoleted Parametric Test Products
Specifications are not available from this site.

Technical Overview 2009-05-07

TXT TXT 1 KB

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