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CCGA Lead-Free Study
Reliability Testing and Data Analysis of an 1657CCGA (Ceramic Column Grid Array) Package with Lead-Free Solder Paste on Lead-Free PCBs (Printed Circuit Boards).

プロモーション資料 2004-06-04

PDF PDF 480 KB
Pins Test Detects Bondwire Failures
Recently, a high volume 3070 user came across a batch of devices with bad bondwires from the chip vendor. The symptom at ICT was failing "pins" tests (sometimes known as "Chek-Point").

事例紹介 2004-05-26

PDF PDF 53 KB
Vectorless Test EP (VTEP) Goes Head-to-Head with Agilent TestJet
In beta tests, VTEP proved its abilities to improve in-circuit test coverage by over 80 percent compared to Agilent TestJet, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

事例紹介 2003-12-16

PDF PDF 351 KB
3070 05.31: PDU/POD Upgrade
Describes how to install the E1135C PDU and Pod upgrade.

インストール・マニュアル 2003-12-01

PDF PDF 670 KB
Medalist Quality Tool Datasheet
AQT provides statistical quality control and statistical process control analysis for Agilent test systems.

データシート 2003-11-01

PDF PDF 626 KB
Selcom Group Uses Integrated Test to Cut Costs and Increase Business
Selcom Group uses a combination of test technologies from Agilent to meet stringent cost, quality, and shipping targets, allowing Selcom to continue growing and thriving in a difficult worldwide economy.

事例紹介 2003-10-24

PDF PDF 600 KB
3070 05.31: DUT Power Supply Installation
Describes how to install device-under-test power supplies in the 3070 system.

インストール・マニュアル 2003-10-01

PDF PDF 4.53 MB
Step-by-Step Series: Step 9 -Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Published in SMT, October 2003.

記事 2003-10-01

Agilent Quality Tool Testimonials
Learn what users have to say about Agilent Quality Tool.

事例紹介 2003-09-30

Agilent Quality Tool Dashboards
Dashboards are preprogrammed targeted views that perform specific functions within the AQT software.

技術概要 2003-09-30

ScanWorks Reduces Vivace Networks' ICT Costs and Improves Board Quality
This paper discusses how Vivace Networks uses ScanWorks at the benchtop and at in-circuit test to reduce test costs and accelerate time to market in a competitive environment.

事例紹介 2003-07-31

PDF PDF 29 KB
Test Coverage: What Does It Mean when a Board Test Passes?
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

アプリケーション・ノート 2003-07-28

PDF PDF 266 KB
Intelligent Test Framework Software Solutions
Agilent's Intelligent Test Framework (ITF) and it's associated SQC / SPC and repair solutions, are optimized to work with Agilent testers enabling you to achieve your quality targets at a lower cost-per-assembly.

技術概要 2003-07-25

PDF PDF 396 KB
Lucent Demonstrates how ScanWorks for the Agilent 3070 Can Save Nearly $1 Million Per Year
Lucent has demonstrated that reusing ScanWorks boundary-scan tests on the 3070 ICT platform can produce dramatic cost savings through lower test development and fixture costs without giving up test coverage.

事例紹介 2003-07-23

PDF PDF 222 KB
Selecting the Optimal Test Strategy
Written by Stig Oresjo, Agilent Technologies. Published in Circuits Assembly, July 2003.

記事 2003-07-01

Motorola Drives Reliability and Productivity of In-Car Safety Systems with the Agilent 3070
To maintain rigorous testing without hindering assembly line productivity, Motorola chose the Agilent 3070 In-circuit Test System.

事例紹介 2003-06-03

PDF PDF 2.01 MB
3070 05.31: System Installation Manual (Windows)
Describes how to install the 3070 system (MS Windows version).

インストール・マニュアル 2003-06-01

PDF PDF 2.48 MB
3070 05.31: Syntax Reference (Windows)
Describes the syntax of all programming statements used in the 3070 system.

ユーザ・マニュアル 2003-06-01

PDF PDF 7.60 MB
3070 05.31: Data Formats (Windows)
Describes the types of data files in the 3070 system.

ユーザ・マニュアル 2003-06-01

PDF PDF 2.72 MB
3070 05.31: Optional Board Test Applications (Windows)
Describes optional test techniques on the 3070 system.

ユーザ・マニュアル 2003-05-01

PDF PDF 3.59 MB
ScanWorks Completes Successful Assessment at Jabil Circuit
One of the first places electronics manufacturers look to reduce expenses is through the elimination of redundant effort.

事例紹介 2003-03-21

PDF PDF 661 KB
Testing Transformers on Unpowered Systems
This paper explains how to test basic analog parts, using unpowered systems.

アプリケーション・ノート 2003-03-21

PDF PDF 10 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

アプリケーション・ノート 2003-03-01

PDF PDF 242 KB
Using Boundary Scan to Link Design and Manufacturing Test
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

アプリケーション・ノート 2003-03-01

PDF PDF 502 KB
What to Consider When Selecting the Optimal Test Strategy
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Agilent has performed in the quest to find the optimal test / inspection strategy.

アプリケーション・ノート 2003-03-01

PDF PDF 175 KB

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