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Burn-In Test - LXinstruments
Burn-in Testing Solutions from LXinstruments and Agilent.

Solution Brief 2012-12-04

34945A, L4445A & L4490A/L4491A Configuration Guide
This configuration guide includes Agilent’s new L4490A and L4491A RF Switch Platforms and adds increased emphasis on selection and configuration of 34945A, L4445A, and L4490A/L4491A - based systems.

Configuration Guide 2012-08-30

PDF PDF 740 KB
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LXI Functional Test - LXinstruments
LXI Functional Test Solutions from LXinstruments and Agilent.

Solution Brief 2012-06-22

Modular Functional Test – Circuit Check
Modular Functional Test Solutions from Circuit Check and Agilent

Solution Brief 2012-06-09

LXI Brochure
The Agilent LXI Brochure shows you how to open the door to simpler system creation.

Brochure 2011-06-16

Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment
Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment.

Application Note 2009-03-04

PDF PDF 711 KB
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Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

PDF PDF 234 KB
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The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2006-11-27

PDF PDF 646 KB
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Tips and Tricks for Using USB, LAN and GPIB
This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C.

Application Note 2006-05-03

PDF PDF 277 KB
Defining three classes of LAN eXtensions for Instrumentation (LXI)
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.

Application Note 2006-01-12

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

PDF PDF 241 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB