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제품 카테고리별
1-25 / 88
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
어플리케이션 노트 2013-05-10 |
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2.02 MB
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Press Releases for N5990A
Press Releases for N5990A
보도자료 2013-05-06 |
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DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
브로셔 2012-12-19 |
PDF
5.17 MB
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
브로셔 2012-12-19 |
PDF
1.14 MB
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Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.
어플리케이션 노트 2012-05-02 |
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6.46 MB
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
어플리케이션 노트 2012-02-02 |
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1.59 MB
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PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.
브로셔 2012-01-17 |
PDF
1.26 MB
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
어플리케이션 노트 2012-01-12 |
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Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Agilent
솔루션 개요 2011-12-02 |
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
어플리케이션 노트 2011-10-28 |
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1.01 MB
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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.
어플리케이션 노트 2011-07-28 |
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
어플리케이션 노트 2011-07-08 |
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1.77 MB
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N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.
데이터시트 2011-04-13 |
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3.07 MB
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HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
브로셔 2010-05-20 |
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1.37 MB
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Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
브로셔 2009-12-08 |
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1.43 MB
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
어플리케이션 노트 2009-08-14 |
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Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.
어플리케이션 노트 2009-06-01 |
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Power Toolbox for Embedded System Designs
Properly Powering On and Off Multiple Power Inputs in Embedded Designs
어플리케이션 노트 2009-06-01 |
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Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.
어플리케이션 노트 2009-03-24 |
PDF
606 KB
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Using Equalization Techniques on Your Infiniium 90000A Series Oscilloscope
A transmitter sends a serial signal over a transmission channel (examples: backplane, cable) to a receiver. As the signal rate increases, the channel the signal travels through distorts the signal at the receiver.
어플리케이션 노트 2009-02-17 |
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Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.
어플리케이션 노트 2008-11-20 |
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
어플리케이션 노트 2008-08-18 |
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1.87 MB
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Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes,
“integrated debugging” is a reality, and it leads you directly to the root cause of problems.
어플리케이션 노트 2008-01-30 |
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1.17 MB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
어플리케이션 노트 2008-01-30 |
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1.91 MB
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
브로셔 2007-10-19 |
PDF
1.12 MB
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