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Bit Error Ratio Test (BERT) Solutions
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1-12 of 12
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Press Releases for 81250
Press Releases for 81250
Press Materials 2013-05-09 |
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Press Releases for N2101B
Press Releases for N2101B
Press Materials 2013-05-06 |
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Press Releases for N5990A
Press Releases for N5990A
Press Materials 2013-05-06 |
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Press Releases for N4916A
Press Releases for N4916A
Press Materials 2013-05-06 |
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Press Releases for N4916B
Press Releases for N4916B
Press Materials 2013-05-06 |
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Press Releases for N4876A
Press Releases for N4876A
Press Materials 2013-05-06 |
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Press Releases for N4917A
Press Releases for N4917A
Press Materials 2013-05-06 |
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Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs
Press Materials 2013-04-24 |
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Industry-first solution for testing SD UHS-II receivers
Automated Solution Based on J-BERT Accelerates Testing of SD Memory Card Host and Device Receivers
Press Materials 2013-04-24 |
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Agilent to Acquire Centellax’s Test and Measurement Business
Agilent Technologies Inc. (NYSE: A) and Centellax today announced they have signed a definitive agreement for Agilent to acquire the assets of Centellax's test and measurement business.
Press Materials 2012-04-27 |
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Electrical and Optical Clock Data Recovery Solutions
Agilent Technologies Inc. (NYSE: A) today introduced a new family of instrumentation-grade clock recovery solutions for optical and electrical testing of high-speed digital communications components and systems. The solutions offer the industry's highest bandwidth and low jitter performance at significantly lower cost than similar products.
Press Materials 2012-02-28 |
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Press Releases for N4903B
Press Releases for N4903B
Press Materials 2009-11-11 |
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