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Can I use non-Agilent resistivity test fixtures with the 4339B?
Yes, as long as the resistivity test fixture has connectivity to the 4339B, it can be used with the 4339B. It is recommended that the 16117C test leads be used to connect a non-Agilent test fixture.

FAQ 2008-06-10

Is there any test fixture for the 4339B to measure SMD components at test voltages above 100 V dc?
The 16339A Component Test Fixture is available.

FAQ 2008-06-10

Can I read the offset current data of OPEN correction and reload it to the 4339B over the GPIB?
You can read the offset current data of OPEN correction over GPIB, but cannot reload it in the 4339B.

FAQ 2008-06-10

Why does the insulation resistance of a capacitor measured by the 4339B vary depending on the lapse of measurement time?
It is because the charge current and dielectric absorption current which flow into the capacitance of the DUT vary depending on the lapse of time.

FAQ 2008-06-10

What are the criteria to be applied when choosing the instrument for C-V measurements from the 4294A and E4980A?
It depends on the size and the thickness of the gate oxide film of the device.

FAQ 2008-05-26

What is the method of minimizing a measurement data gap at 5 MHz for liquid material measurements using the 16452A?
Since the 16452A is a cell type liquid test fixture which is difficult to connect a load device for Load compensation, the following method is recommended.

FAQ 2008-05-26

How can the 4294A apply a DC bias voltage over 40V to DUT?
An external DC source and a protection circuit need to be used with the 4294A to apply a DC bias voltage over 40V. For biasing axial and radial lead type DUT, the 16165A with a built-in protection circuit is available.

FAQ 2008-05-26

Can I use the 16454A with an LCR meter or Impedance Analyzer other than the E4991A-002 or 4291A/B-002?
Yes, basically, it is recommended to use an Impedance Analyzer with I-Basic programming function in order to automate the permeability calculation.

FAQ 2008-05-20

Why is it recommended to pre-form electrodes on both sides of thin film materials measured with the 16451B?
Pre-forming electrodes on both sides of film materials can minimize measurement errors due to air gaps between 16451B's electrodes and the material.

FAQ 2008-05-20

What are significant error sources when a thin film material is measured with the 16451B?
Small air gaps become primary error source for the permittivity measurement of thin materials.

FAQ 2008-05-20

How large power can be applied to individual standard resistors of the 42030A?
It is recommended that the applied test signal level is less than 0.1 W. For resistors below 1 Ω, test current should be less than 0.5 A rms.

FAQ 2008-05-20

What is the electrical length value defined for the 16453A?
The electrical length is 0 mm. This value is not required for measurement because calibration is performed at the electrode plane of the 16453A.

FAQ 2008-05-20

What is the electrical length value defined for the 16454A?
The electrical length of the 16454A has been preset to the E4991A as 0 mm.

FAQ 2008-05-20

Can I use somehow the 16453A for measurements up to 3 GHz?
No, the maximum usable frequency is 1 GHz because measurement uncertainty due to residual impedance of the 16453A rapidly increases at higher frequencies.

FAQ 2008-05-20

Can I use the 16118A to measure a resistance of high-value capacitor?
Yes, the 16118A can be used for measurement up to R (GΩ) x C (µF) ≤ 0.2 GΩ µF.Required charging time is approximately 1.5 x C (µF) seconds.

FAQ 2008-05-19

Does the 16008B comply with a certified method of national standard?
The 16008B is compatible with ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials.

FAQ 2008-05-15

Is it possible to measure the leakage inductance of a transformer via an LCR meter or impedance analyzer?
Yes, it is possible to measure the leakage inductance of a transformer via an LCR meter or impedance analyzer.

FAQ 2008-01-29

What resources does Agilent recommend to help facilitate learning proper impedance measurement techniques?

FAQ 2008-01-14

What is the minimum size SMD (surface mount device) that the Agilent 16095A probe test fixture can measure?
The 16095A standard probe tip diameter is approximately 1.0 mm...

FAQ 2008-01-14

While measuring capacitors with my Agilent impedance analyzer, I am realizing negative values for Q and D. Can you advise?
For low loss devices (high Q, low D) it is not uncommon to realize negative readings on an LCR meter / Impedance analyzer. Note that the negative reading is physically impossible (for passive components) and the following explanation is provided.

FAQ 2007-09-14

On my Agilent Impedance Analyzer, I am realizing measurement results which appear questionable. Can you explain?
The measurement results can often be improved with a simple modification in the type of correction applied by the instrument.

FAQ 2007-08-28

How do I calculate the accuracy of 4284A when the desired stimulus is RMS current rather than RMS voltage?
The Agilent 4284A data sheet provides measurement accuracy as a function of stimulus level in RMS volts.

FAQ 2007-05-09

On the Agilent 4291A/B Impedance Analyzer, can I utilize a Standard Network Analyzer Calibration Kit to perform the test head calibration?
Test head calibration on the Agilent 4291A/B impedance analyzer is only supported with the included 4291A/B standards.

FAQ 2007-02-15

While in the Spectrum Analyzer Mode on my Agilent 4395A Combination Analyzer, I can not modify the sweep time. Why?

FAQ 2007-01-02

What is the recommended procedure for measuring the impedance tangent delta?

FAQ 2005-04-19

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