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Dynamic Signal Analyzers, Materials Measurement

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Measuring Dielectric Properties using Agilent's Materials Measurement Solutions - Brochure
Quick guide for Agilent materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2013-04-05

PDF PDF 478 KB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Notes d’application 2013-04-03

PDF PDF 3.60 MB
Langues 
85071E Web Help
Instantly view the very latest information in the Materials Measurement software’s help file.

Fichier d'aide 2012-06-27

85070E Web Help
Instantly view the very latest information in the Dielectric Probe Kit software’s help file.

Fichier d'aide 2012-06-27

85071E Materials Measurement Software - Technical Overview
Agilent 85071E software determines the intrinsic electromagnetic properties of many dielectric and magnetic materials. The complete system is based on a versatile network analyzer that measures the material's response to RF or microwave energy. This 8-page, black & white product overview contains a product description, features and benefits, performance characteristics, software models and ordering information.

Présentation technique 2012-06-15

PDF PDF 1.36 MB
Langues 
85070E Dielectric Probe Kit, 200 MHz to 50 GHz - Technical Overview
Agilent's 85070E is a dielectric probe kit that is used to measure the intrinsic electrical properties of materials in the RF and microwave frequency bands. The 85070E software allows you to measure the complex dielectric constant of liquids and semisolids, including the dielectric loss factor or loss tangent. This 12-page, black and white technical overview contains product description, features/benefits, performance characteristics, menu items, and ordering information.

Présentation technique 2012-06-14

PDF PDF 1.69 MB
Langues 
85072A 10-GHz Split Cylinder Resonator
This technical overview provides an overview of features, measuring examples, and specification of the 85072A 10 GHz split cylinder resonator.

Présentation technique 2012-05-08

PDF PDF 989 KB
85072A 10 GHz Split-Cylinder Resonator User’s and Service Guide
Provides information on making measurements, specifications, maintenance & troubleshooting, replaceable parts, and replacement procedures for the 85072A.

Manuel de l'utilisateur 2012-05-01

PDF PDF 1.65 MB
LCR Meters, Impedance Analyzers and Test Fixtures Selection Guide
This 16-page, black-and-white selection guide matchesapplications to LCR meters, Impedance analyzer, and fixtures cotains brief information on products and applicationliteratures.

Guide de sélection 2012-04-09

PDF PDF 903 KB
Langues 
Declaration of Conformity
Search Agilent Regulatory database for most recent Declaration of Conformity statement for your product.

Fichier d'aide 2010-10-15

35670A Installation and Verification Guide

Manuel d’installation 2010-03-01

PDF PDF 3.56 MB
35670A Operator's Guide
35670-90053. Contains chapters on making measurements, working with the display, using the basics, and much more.

Manuel de l'utilisateur 2010-03-01

PDF PDF 3.92 MB
35670A Service Guide
Manual publication number 35670-90066.

Manuels d'entretien 2010-03-01

PDF PDF 11.84 MB
GPIB Programming with the Agilent 35670A
This manual contains the command syntax, structure and a detailed description of each GPIB command available for the Agilent 35670A. In addition, it contains instrument-specific information not available in the GPIB Programmer's Guide.

Guide de programmation et de syntaxe 2010-03-01

PDF PDF 2.92 MB
35670A Quick Start Guide

Guide de démarrage rapide 2010-03-01

PDF PDF 1.89 MB
Antenna Test Selection Guide
Agilent provides many of the components required to make accurate antenna and radar cross-section (RCS) measurements

Guide de sélection 2009-09-03

PDF PDF 2.41 MB
Langues 
Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Notes d’application 2009-06-17

PDF PDF 2.02 MB
Langues 
Network Analyzer Selection Guide (For Reference Only - Includes Discontinued Products)
This document does not contain the most up-to-date information. The document is available for reference only, for customers using legacy network analyzers. Current document: http://cp.literature.agilent.com/litweb/pdf/5989-7603EN.pdf

Guide de sélection 2009-02-03

PDF PDF 1.95 MB
Langues 
35670A Dynamic Signal Analyzer Product Overview
The Agilent 35670A is a portable two- or four-channel dynamic signal analyzer with the versatility to be several instruments at once.

Présentation technique 2009-01-12

PDF PDF 1.47 MB
35670A Dynamic Signal Analyzer Data Sheet
Technical specifications for the 35670 Dynamic Signal Analyzer.

Fiche signalétique 2009-01-09

PDF PDF 131 KB
Installation Guide, 85070/1E Dielectric Probe Kit and Materials Measurement Software
Provides instructions for installing and configuring the 85070E and 85071E software products.

Manuel d’installation 2009-01-01

PDF PDF 288 KB
Accessories Selection Guide For Impedance Measurements
Impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination Analyzers

Guide de sélection 2008-12-17

PDF PDF 2.53 MB
Langues 
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.

Notes d’application 2008-10-28

PDF PDF 1.65 MB
Langues 
N5264A PNA-X Measurement Receiver Flyer
photo card

Matériel de promotion 2008-10-17

PDF PDF 308 KB
A Refresher Course on Windowing and Measurements
In these days of digital instrumentation and PCs, it is easy to forget that physical phenomena are analog and that windows are not always operating systems. Windowing and digitization meet in the process of dynamic signal analysis. This Realtime Update article, Fall 1995 - Winter 1996, Hewlett...

Article 2007-02-22

PDF PDF 90 KB

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