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1-25 of 405

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing. Application Note 2013-05-10	PDF 2.02 MB Languages English \| 2013-05-10 \| PDF 2.02 MB 日本語 \| 2010-01-14 \| PDF 3.64 MB
GNSS Technologies and Receiver Testing - Application Note This application note provides information on GNSS technologies including GPS, Compass, Beidou, Galileo, and Glonass, along with the related receiver test challenges and solutions. Application Note 2013-05-08	PDF 3.63 MB
Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges. Application Note 2013-04-29	PDF 1.32 MB Languages English \| 2013-04-29 \| PDF 1.32 MB Pусский \| 2011-09-07 \| PDF 1.07 MB
Overvoltage Protection in Power Supplies - Application Note This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications Application Note 2013-04-18	PDF 832 KB
Radar Distance Test to Airborne Planes - Application Note Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry. Application Note 2013-04-11	PDF 904 KB
PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis Application Note 2013-04-08	PDF 736 KB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test. Application Note 2013-04-05	PDF 748 KB
Power Essentials Resource Kit A collection of technical content and tools to help you get the most out of your bench or system power supply. Application Note 2013-04-03
Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system. Application Note 2013-04-01	PDF 476 KB
DVB-T and DVB-T2 Transmitter Test Challenges - Application Note This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of transmitters for these systems. Application Note 2013-02-27	PDF 986 KB
Pulse Parameter Definitions - Application Note Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A Application Note 2013-02-14	PDF 793 KB
Testing DVB-T and DVB-T2 Receivers - Application Note This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of receivers such as set-top-boxes. Application Note 2013-02-02	PDF 716 KB
Diode Evaluation Using the Agilent B2911A This technical overview shows how the Agilent B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes. Application Note 2013-01-22	PDF 2.83 MB Languages English \| 2013-01-22 \| PDF 2.83 MB 日本語 \| 2011-04-14 \| PDF 815 KB 中文（繁體） \| 2012-01-03 \| PDF 1.18 MB
Addressing the Challenges of Deploying Single Frequency Networks DVB-T & DVB-T2 - Application Note This application addresses the challenges of deploying SFN systems for digital video broadcasting and describe's Agilent's solutions for meeting these challenges. Application Note 2013-01-17	PDF 1.58 MB
LED IV Measurement Using the Agilent B2911A This technical overview describes the use of LED IV measurements using the B2900 Series Precision source/measure unit. Application Note 2013-01-07	PDF 1.72 MB Languages English \| 2013-01-07 \| PDF 1.72 MB 日本語 \| 2011-10-27 \| PDF 678 KB 中文（繁體） \| 2011-07-11 \| PDF 836 KB
Resistor Production Test Using the Agilent B2911A This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test. Application Note 2013-01-07	PDF 1.29 MB Languages English \| 2013-01-07 \| PDF 1.29 MB 日本語 \| 2011-10-27 \| PDF 629 KB
LED Production Test Using the Agilent B2911A This technical overview describes LED production test using the B2900A series precision source/measure unit. Application Note 2013-01-07	PDF 1.69 MB Languages English \| 2013-01-07 \| PDF 1.69 MB 日本語 \| 2011-10-27 \| PDF 626 KB
Thermistor Production Test Using the Agilent B2911A This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test. Application Note 2013-01-07	PDF 1.33 MB Languages English \| 2013-01-07 \| PDF 1.33 MB 日本語 \| 2011-10-27 \| PDF 652 KB
Diode Production Test Using the Agilent B2911A This technical overview shows how to use the Agilent B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test. Application Note 2013-01-07	PDF 1.65 MB Languages English \| 2013-01-07 \| PDF 1.65 MB 日本語 \| 2011-04-14 \| PDF 1 MB
IV characterization of OLEDs using the Agilent B2911A This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units. Application Note 2013-01-07	PDF 1.81 MB Languages English \| 2013-01-07 \| PDF 1.81 MB 日本語 \| 2011-12-05 \| PDF 793 KB 中文（繁體） \| 2012-01-04 \| PDF 1.09 MB
Varistor Evaluation Using the Agilent B2900A Series This application introduces features of B2900A Series as the best solution for accurate characterization of varistor and other two terminal devices. Application Note 2013-01-07	PDF 1.42 MB Languages English \| 2013-01-07 \| PDF 1.42 MB 日本語 \| 2011-04-14 \| PDF 759 KB 中文（繁體） \| 2012-01-31 \| PDF 839 KB
Varistor Production Test Using the Agilent B2911A This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test. Application Note 2013-01-07	PDF 1.13 MB Languages English \| 2013-01-07 \| PDF 1.13 MB 日本語 \| 2011-04-14 \| PDF 783 KB
Resistance Measurements Using the Agilent B2911A This technical overview describes the use of the B2900 series of precision source/measure units for resistance measurements Application Note 2013-01-07	PDF 1.88 MB Languages English \| 2013-01-07 \| PDF 1.88 MB 日本語 \| 2011-04-14 \| PDF 708 KB 中文（繁體） \| 2012-01-03 \| PDF 735 KB
Characterization of Bipolar Transistors Using the Agilent B2912A This technical overview describes the characterization of Bipolar transistors using the B2900a precision source/measure units. Application Note 2013-01-07	PDF 1.92 MB Languages English \| 2013-01-07 \| PDF 1.92 MB 日本語 \| 2011-10-27 \| PDF 863 KB
LIV Test of Laser Diode Using the Agilent B2912A This application introduces features of B2900A Series as the best solution for LIV test of laser diode. Application Note 2013-01-07	PDF 1.76 MB Languages English \| 2013-01-07 \| PDF 1.76 MB 日本語 \| 2011-04-14 \| PDF 901 KB 中文（繁體） \| 2012-01-11 \| PDF 1023 KB

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