Contact an Expert

Technical Support

Test & Measurement

Find by Product Model Number: Examples: 34401A, E4440A

1-25 of 25

Sort:
8 Hints for Making Better Measurements Using RF Signal Generators Application Note
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2012-06-27

PDF PDF 1.35 MB
Optimizing Dynamic Range for Distortion Measurements
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2011-10-27

PDF PDF
Test and Measurement Instrument Security
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.

Application Note 2009-04-14

PDF PDF 167 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Application Note 2007-03-16

PDF PDF 345 KB
Bluetooth® RF Measurement Fundamentals - Application Note
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Application Note 2006-10-12

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
Choosing Your Test System Software Architecture (AN 1465-4) - Application Note
The information presented here will help you choose the direction for your software based on the application you have in mind and the amount of experience you have.

Application Note 2004-12-21

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.

Application Note 2004-08-02

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Jitter Analysis Techniques for High Data Rates (AN 1432) - Application Note
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

Power Supply Testing (AN 372-1)
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.

Application Note 2002-02-22

How to use the Agilent 81200 together with Agilent VEE - Application Note
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.

Application Note 2002-01-28

PDF PDF 383 KB
8 Hints for Making Better Measurements Using Analog RF Signal Generators
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2001-11-14

Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1)
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.

Application Note 2001-11-01

Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B)
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary of network analyzers and their capabilities.

Application Note 2001-09-17

Improving Network Analyzer Measurements of Frequency-translating Devices (1287-7) – Application Note
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

Timing Considerations in Clock Distribution Networks (AN 1210-10) - Application Note
This Application Note discusses the different causes of skew in a clock distribution network. It shows how to use the Agilent 8133A and 54720A to measure and analyze the causes.

Application Note 1992-09-01

PDF PDF 253 KB