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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.

Application Note 2007-09-19

I/Q Modulation Considerations for PSG Vector Signal Generators
This application note on I/Q modulation covers I/Q modulator operation, I/Q modulator imperfections, a simplified block diagram of the PSG vector signal generator.

Application Note 2007-07-24

PDF PDF 838 KB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices - App Note
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Biasing Multiple Input Voltage Devices in R&D
This application brief describes using the voltage output synchronization capabilities of modular power supplies in R & D multiple bias applications.

Application Note 2007-05-07

Evaluation Methods for Automotive Network Topologies - Application Note
Agilent Evaluation Methods for Automotive Network Topologies

Application Note 2007-05-03

PDF PDF 1.79 MB
Accelerate Vehicle Charging System Simulation with the N6705A DC Power Analyzer
This application brief describes how the Agilent N6705A DC Power Analyzer can simulate vehicle charging system power waveforms for R & D electrical component testing.

Application Note 2007-04-30

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
RS-232 Troubleshooting - Application Note
In the course of dealing with personal computers, you may have the RS-232 serial interface. This paper will describe RS-232 at a basic level, with an orientation towards Windows-based instrument programming.

Application Note 2007-04-18

PDF PDF 171 KB
Using COM-based Formatted I/O In Microsoft Visual Basic 6 - Application Note
SCPI-based instrument communication in Microsoft Visual Basic has often been counterintuitive to programmers familiar with the VB I/O facilities. The VISA COM I/O provides a formatted I/O library that works especially well in VB.

Application Note 2007-04-18

PDF PDF 153 KB
Powering DC-to-DC Converters Using the Agilent N6705A DC Power Analyzer
This application brief describes an example of how an R&D engineer can test DC-to-DC converters using capabilities of the N6705A DC Power Analyzer.

Application Note 2007-04-11

AN B1500A-8 Multi-Channel Parallel Timing-on-the-fly NBTI Characterization Using Agilent B1500A
This four-page application note details how to implement the parallel NBTI using the B1500A by showing a preparation of the device setup for parallel testing.

Application Note 2007-04-01

The Programming of USB Instruments - Application Note
This article provides information setting up a test system with USB instruments and how to program using VISA IO Library software. The T&M USB protocol specifications, and how these protocol specifications make use of USB endpoints, are included.

Application Note 2007-03-30

PDF PDF 2.44 MB
Porting SICL Applications to VISA - Application Note
This article is intended to assist you in the job of porting a C or C++ SICL program to VISA. It includes a table of the VISA functions and attributes which correspond to each SICL function.

Application Note 2007-03-30

PDF PDF 493 KB
Programming Considerations for using VISA with Visual Basic 6 - Application Note
This short paper describes how to develop Visual Basic applications using VISA for instrument I/O.

Application Note 2007-03-30

PDF PDF 125 KB
Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Application Note 2007-03-16

PDF PDF 345 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A - App Note
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
Evaluating Battery Run-down Performance of the 66319D and the 14565B (AN 1427)
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2007-01-31

HSDPA RF Measurements for User Equipment - Application Note
This application note explains the meaning and purpose of the new industry standards for RF conformance tests of HSDPA-capable user equipment and provides Agilent test solutions.

Application Note 2007-01-18

Concepts of HSDPA - Application Note
Bringing increased throughput and efficiency to W-CDMA

Application Note 2007-01-18

Mobile Communications Device Testing (AN 1310)
Pulsed battery drain currents, regulated charge currents, and remote DUT fixtures, dictate the need for specialized power sourcing, loading, and measurement capabilities for testing mobile communications devices.

Application Note 2007-01-16

PDF PDF 251 KB
Current Drain Analysis Enhances WLAN Network Card Design and Test (AN 1468)
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

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