Technical Support
Test et mesure électronique
Refine the List
Par application
-
Toutes les applications
- High-Speed Digital
By Type of Content
- Document Library
-
Application Notes
- Application Note
Par catégorie de produit
-
Toutes les catégories de produit
-
Generators, Sources, Supplies
-
Pulse Generator Products
- 81110A Pulse Pattern Generator, 165/330 MHz (1)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (2)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (4)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (6)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (6)
-
Pulse Generator Products
-
Generators, Sources, Supplies
-
Application Notes
1-16 of 16
|
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Application Note 2013-05-10 |
|
|
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
Application Note 2011-10-28 |
|
|
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.
Application Note 2009-03-24 |
|
|
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Application Note 2008-08-18 |
|
|
Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
Application Note 2008-01-30 |
|
|
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices
Application Note 2007-06-19 |
|
|
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages
Application Note 2007-01-31 |
|
|
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...
Application Note 2006-12-12 |
|
|
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.
Application Note 2006-07-18 |
|
|
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.
Application Note 2006-01-30 |
|
|
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.
Application Note 2005-09-21 |
|
|
Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement
Application Note 2005-08-29 |
|
|
PCI Express Receiver Design Validation Test with 81134A / 81250A
Describes functional validation and compliance and stress tests for PCI Express receiver design
Application Note 2005-03-18 |
|
|
Advanced Jitter Generation and Analysis Product Note
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.
Application Note 2004-10-04 |
|
|
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.
Application Note 2003-06-30 |
|
|
Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
Application Note 2003-02-03 |
|
