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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

PDF PDF 2.02 MB
Sprachen 
J-BERT N4903B High-Performance Serial BERT - Data Sheet Version 1.3
This data sheet documents the capabilities of the N4906B, Agilent's high-performance serial BERT for R&D characterization compliance testing and for manufacturing volume ramp testing.

Data Sheet 2013-04-10

PDF PDF 1.90 MB
Sprachen 
PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

Brochure 2012-01-17

PDF PDF 1.26 MB
How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

PDF PDF 3.22 MB
Sprachen 
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Application Note 2011-09-01

PDF PDF 2.20 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

PDF PDF 4.82 MB
Sprachen 
N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Data Sheet 2011-04-13

PDF PDF 3.07 MB
HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2010-05-20

PDF PDF 1.37 MB
Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2009-12-08

PDF PDF 1.43 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2009-03-24

PDF PDF 606 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse

Application Note 2008-12-03

PDF PDF 1000 KB
Upgrade to PCI Express 2.0© Receiver Test
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.

Application Note 2008-10-24

PDF PDF 348 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
Jitter Solutions for Telecom, Enterprise, and Digital Designs
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.

Brochure 2008-06-25

PDF PDF 3.49 MB
Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.

Application Note 2008-01-30

PDF PDF 1.91 MB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
BERT Application Brochure
Answers for your multi-gigabit test challenges

Brochure 2007-01-15

PDF PDF 1.37 MB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...

Application Note 2006-12-12

PDF PDF 382 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
Mastering Jitter in Serial Gigabit Designs
Mastering Jitter in Serial Gigabit Designs

Promotional Materials 2006-06-22

PDF PDF 1.01 MB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.

Application Note 2006-01-30

PDF PDF 1.31 MB
Sprachen 
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

Application Note 2005-09-21

PDF PDF 356 KB
Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

Application Note 2005-08-29

PDF PDF 1.28 MB

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