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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

应用说明 2013-05-10

Double Pulse Generation for Particle Image Velocimetry (PIV) Measurements - Technical Overview
Agilent Technologies' Pulse/Pattern Generators are used for research in the aerospace and defense industry, among others.

技术总览 2013-05-06

PDF PDF 2.67 MB
Simulation of Jittering Synchronization Signals for Video Interfaces - Technical Overview V2.0
This product note describes how R&D engineers in the communication industry use Agilent Technologies pulse generators for development of video interfaces for projection units.

技术总览 2013-04-24

PDF PDF 834 KB
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

应用说明 2013-04-11

PDF PDF 904 KB
J-BERT N4903B High-Performance Serial BERT - Data Sheet Version 1.3
This data sheet documents the capabilities of the N4906B, Agilent's high-performance serial BERT for R&D characterization compliance testing and for manufacturing volume ramp testing.

产品资料 2013-04-10

Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

应用说明 2013-02-14

PDF PDF 793 KB
Pulse Pattern Generators - Selection Guide
This document is aimed to offer an overview of Agilent's Pulse Pattern Generator portfolio in all speed ranges, from low to high.

选型指南 2013-01-25

PDF PDF 100 KB
N5990A Test Automation Software Platform - Data Sheet, Version 3.1
An efficient test strategy is a proven competitive advantage. Agilent's N5990A Test Automation Software Platform is a key element of winning strategies.

产品资料 2013-01-23

PDF PDF 1.54 MB
J-BERT N4903B High-Performance Serial BERT - User's Guide
The Serial BERT can help you test the performance of components and systems for high-speed digital transmission equipment. An important parameter of a digital system is the rate at which errors occur in the system. The analyzer will compare the bits sent to your device with the bits received from your device. It will record the number of bit errors and display results such as the bit error ratio (BER). In addition, accumulated results can be analyzed to help you determine what caused the bit errors. (Verison 7.40)

用户手册 2013-01-01

J-BERT N4903B High-Performance Serial BERT - Programming Guide
Released with N4903B Software 7.40. This document provides the information you need for programming the Serial BERT using the Agilent IO Libraries Suite. Familiarity with the Agilent IO Libraries Suite is instrumental in understanding remote programming of the Serial BERT. See the user documentation delivered with the Agilent IO Libraries Suite for information on how to use them.

编程和语法指南 2013-01-01

N4903B J-BERT Getting Started Guide
Revision 10 (Released with N4903B Software 7.40).

迅速开始指南 2013-01-01

Testing Circuit Board Power Distribution Using Real World Distortions - Application Note
Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits.

应用说明 2012-11-26

PDF PDF 368 KB
N4917A Optical Receiver Stress Test Solution Data Sheet Version 1.3
N4917A optical receiver stress test solution allows repeatable and accurate optical stress for receiver tolerance test of 10GbE 802.3ae -LR, -ER, -SR, 8G, and 10G FC transceivers.

产品资料 2012-05-23

PDF PDF 1.78 MB
Pulse Function Arbitrary Noise Generator Demo
The Agilent 81150A Pulse Function Arbitrary Noise Generator is a new 3-in-1 instrument, offering accurate Pulse, Function Arbitrary and Noise Generation in a single box.

基本演示 2012-05-21

2012 年光波产品目录--光-电-数字测试
《2012 年安捷伦光波产品目录》可让您了解到安捷伦如何帮助您实现愿景。

产品目录 2012-05-01

PDF PDF 3.54 MB
Video - Glitch free changing of timing parameters
How to change timing parameters in real time and without glitches with the new 81160A Pulse Function Arbitrary Noise Generator

基本演示 2012-04-26

N4880A Reference Clock Multiplier Data Sheet
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

产品资料 2012-04-16

PDF PDF 3.31 MB
81133A and 81134A, 3,35 GHz Pulse-/Pattern Generators - Data Sheet
81133A and 81134A, 3,35 GHz Pulse-/Pattern Generators Data Sheet

产品资料 2012-03-14

PDF PDF 595 KB
N2101B 10.3125 Gb/s Bit Error Ratio Tester - Data Sheet
The N2101B PXIT 10.7 Gb/s Bit Error Ratio Tester consists of a high accuracy clock source, data pattern generator, and error detector. It will automatically perform bit error ratio analysis to characterize the quality of devices at 10 standard internal rates from 155 Mb/s to 8.5 Gb/s.

产品资料 2012-01-27

PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

手册 2012-01-17

PDF PDF 1.26 MB
Agilent 81150A Pulse Function Noise Generator - Connectivity Demo
This video provides you with an onscreen insight into LXI Class C and IntuiLink connectivity, using the new Agilent 81150A pulse function arbitrary noise generator.

基本演示 2011-12-07

Agilent 81150A Pulse Generator Pattern Width Modulation Demo
This video provides you with an onscreen demonstration of pulse width modulation software functions connected via LAN to PC, using the new Agilent 81150A pulse function arbitrary noise generator.

基本演示 2011-12-07

How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

应用说明 2011-11-30

N2102B Pattern Generator
This flyer provides a brief description of the features and benefits of the N2102B Pattern Generator

手册 2011-11-27

PDF PDF 310 KB
Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

应用说明 2011-11-03

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