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Oscilloscopes, Analyzers, Meters
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1-7 of 7
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DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
Brochure 2012-12-19 |
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
Brochure 2012-12-19 |
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PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.
Brochure 2012-01-17 |
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HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
Brochure 2010-05-20 |
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Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
Brochure 2009-12-08 |
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Jitter Solutions for Telecom, Enterprise, and Digital Designs
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.
Brochure 2008-06-25 |
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
Brochure 2007-10-19 |
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