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Boundary Scan Online Training Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk! 교육 자료 2010-01-28
Boundary Scan Test Methods for DDR Memories In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug. 교육 자료 2011-03-28
DfT rules for boundary scan during ICT Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test. 교육 자료 2009-12-01	PDF 276 KB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing. 교육 자료 2010-12-21