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Electronic Measurement

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The Importance and Value of PXI Multi-Vendor Interoperability
Original broadcast March 28, 2012

Webcast - recorded

Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011

Webcast - recorded

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded