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1-25 of 26

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing. Application Note 2013-05-10	PDF 2.02 MB Languages English \| 2013-05-10 \| PDF 2.02 MB 日本語 \| 2010-01-14 \| PDF 3.64 MB
How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative. Application Note 2011-11-30	PDF 3.22 MB Languages English \| 2011-11-30 \| PDF 3.22 MB 日本語 \| 2012-07-20 \| PDF 4.98 MB
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products. Application Note 2011-10-28	PDF 1.01 MB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Application Note 2011-09-01	PDF 2.20 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0. Application Note 2011-06-22	PDF 4.82 MB Languages English \| 2011-06-22 \| PDF 4.82 MB 日本語 \| 2011-07-27 \| PDF 3.05 MB
Power Toolbox for Embedded System Designs Properly Powering On and Off Multiple Power Inputs in Embedded Designs Application Note 2009-06-01	PDF 163 KB Languages English \| 2009-06-01 \| PDF 163 KB 日本語 \| 2009-07-24 \| PDF 515 KB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P This document describes the requirements for forward clocking topology RX Jitter tolerance testing. Application Note 2009-03-24	PDF 606 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse Application Note 2008-12-03	PDF 1000 KB
Upgrade to PCI Express 2.0© Receiver Test The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade. Application Note 2008-10-24	PDF 348 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test Method of Implementation (MOI) for DisplayPort Sink Compliance Test Application Note 2008-08-18	PDF 1.87 MB
Solutions for MB-OFDM Ultra-Wideband (UWB) Application Note Application note describes hardware and software for ultra wideband (UWB) testing. Application Note 2008-08-10	PDF 2.63 MB Languages English \| 2008-08-10 \| PDF 2.63 MB 日本語 \| 2006-11-02 \| PDF 2.31 MB
Measuring Jitter in Digital Systems (AN 1448-1) Measuring jitter and how to calculate total jitter. Application Note 2008-01-30	PDF 1.91 MB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices Application Note 2007-06-19	PDF 214 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages Application Note 2007-01-31	PDF 272 KB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ... Application Note 2006-12-12	PDF 382 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past. Application Note 2006-07-18	PDF 5.33 MB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices. Application Note 2006-01-30	PDF 1.31 MB Languages English \| 2006-01-30 \| PDF 1.31 MB 中文（简体） \| 2009-04-01 \| PDF 737 KB 中文（繁體） \| 2009-05-18 \| PDF 1.44 MB
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester. Application Note 2005-09-21	PDF 356 KB
Fast Total Jitter Test Solution This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement Application Note 2005-08-29	PDF 1.28 MB
PCI Express Receiver Design Validation Test with 81134A / 81250A Describes functional validation and compliance and stress tests for PCI Express receiver design Application Note 2005-03-18	PDF 2.01 MB Languages English \| 2005-03-18 \| PDF 2.01 MB 日本語 \| 2002-09-10 \| PDF 707 KB
Advanced Jitter Generation and Analysis Product Note This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope. Application Note 2004-10-04	PDF 549 KB
Flat Panel Display Link Test This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Agilent 81250 Parallel Bit Error Ratio Tester (ParBERT). Application Note 2004-07-29	PDF 128 KB Languages English \| 2004-07-29 \| PDF 128 KB 中文（简体） \| 2003-08-19 \| PDF 1.36 MB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals. Application Note 2003-06-30	PDF 1.70 MB Languages English \| 2003-06-30 \| PDF 1.70 MB 日本語 \| 2003-09-22 \| PDF 1.51 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Languages English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
How to use the Agilent 81200 together with Agilent VEE This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis. Application Note 2002-01-28	PDF 383 KB

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