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Simulating Envelope Tracking with Advanced Design System
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2012-11-22

PDF PDF 2.30 MB
Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

PDF PDF 1.11 MB
Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

PDF PDF 506 KB
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How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Genesys S/Filter Software Directly Synthesizes Filters with Arbitrary Transmission Zero Placement
This white paper describes direct filter synthesis capabilities in Agilent Genesys S/Filter design software used to realize custom filter response.

Application Note 2011-01-12

PDF PDF 618 KB
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Automated Measurement with IC-CAP
This application note describes a seamless solution for automated measurement and parameter extraction with Agilent IC-CAP

Application Note 2011-01-10

PDF PDF 1.42 MB
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Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

Application Note 2010-12-20

PDF PDF 3.15 MB
Making Conducted and Radiated Emissions Measurements
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

PDF PDF 1.90 MB
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Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

PDF PDF 1.04 MB
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Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2009-12-02

PDF PDF 250 KB
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I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

Application Note 2009-09-30

PDF PDF 378 KB
Creating Hardware Handler in C/C++ for Agilent TestExec SL
A hardware handler enhances the Agilent TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB
Configuring Signal and Load Switching Using Agilent TestExec SL
This application note describes how users of the Agilent TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software.

Application Note 2009-08-13

PDF PDF 286 KB
AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.

Application Note 2009-08-07

PDF PDF 1.98 MB
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Managing High-Power DC Requirements for Life and Durability Test Systems
New product life and durability testing (Life testing) is critical in highly competitive markets.

Application Note 2009-08-04

PDF PDF 181 KB
Database Connectivity Guide for TestExec SL
This application note outlines the importance of proper data logging in a database and discusses best practices to import extensible markup language (XML) files from TestExec into a database.

Application Note 2009-07-16

PDF PDF 434 KB
Customizing the Agilent TestExec SL Operator Interface using Visual Basic
This application note describes how users of the Agilent TestExec SL software can customize the operator user interface using Visual Basic.

Application Note 2009-07-07

PDF PDF 312 KB
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.

Application Note 2009-06-25

PDF PDF 5.49 MB
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Testing Mechatronic Power Drivers Using the Agilent L4532A/L4534A Digitizers
This 15-page Application Note discusses mechatronics for modern motion control, measurement challenges, using the LXI as a development tool, determinining correct measurement windows, and capturing multiple channels using the L4534A.

Application Note 2009-06-18

PDF PDF 2.93 MB
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Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

PDF PDF 1000 KB
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Testing Terrestrial Solar-Powered Inverters Using Solar Array Simulation Techniques
This application note describes how to test terrestrial solar-powered inverters using solar array simulation techniques.

Application Note 2009-06-01

PDF PDF 220 KB
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Using Two Power Supplies for Higher Current Solar Cell Characterizing
This application note describes the Agilent 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Application Note 2009-04-29

PDF PDF 280 KB
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Network Parameter Measurement: Best Practices using the Agilent Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
Linearization of Multi-Carrier Power Amplifier via Digital Predistortion in ADS
This Application Bulletin describes a method for using digital predistortion in Advanced Design System with the Linearization Design Guide to minimize spectral regrowth in wireless systems.

Application Note 2009-03-19

PDF PDF 582 KB
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Generating I-V Curves with the Agilent E4360A Solar Array Simulator Using the Parameters Voc, Isc, N

Application Note 2009-03-12

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