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How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

PDF PDF 1.04 MB
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Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2009-12-02

PDF PDF 250 KB
Languages 
Creating Hardware Handler in C/C++ for Agilent TestExec SL
A hardware handler enhances the Agilent TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB
Configuring Signal and Load Switching Using Agilent TestExec SL
This application note describes how users of the Agilent TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software.

Application Note 2009-08-13

PDF PDF 286 KB
Database Connectivity Guide for TestExec SL
This application note outlines the importance of proper data logging in a database and discusses best practices to import extensible markup language (XML) files from TestExec into a database.

Application Note 2009-07-16

PDF PDF 434 KB
Customizing the Agilent TestExec SL Operator Interface using Visual Basic
This application note describes how users of the Agilent TestExec SL software can customize the operator user interface using Visual Basic.

Application Note 2009-07-07

PDF PDF 312 KB
Network Parameter Measurement: Best Practices using the Agilent Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Agilent Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

PDF PDF 342 KB
IFT Battery Current Drain Solution
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

Application Note 2008-09-30

PDF PDF 741 KB
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Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Application Note 2008-08-26

PDF PDF 492 KB
Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

PDF PDF 658 KB
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Small Engine Dynamometer Testing
Performing Dynamometer Testing on Combustion Engines

Application Note 2008-06-01

PDF PDF 443 KB
High Node Count Fixturing Solutions for Agilent Short-Wire Test Fixtures
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Agilent 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
The Benefits of Using LXI in Automotive Functional Test
LXI can help maximize performance, minimize cost and extend capital investments into the future. This whitepaper explores the benefits associated with using LXI in Automotive Functional test.

Application Note 2007-11-29

PDF PDF 471 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Application Note 2007-10-31

PDF PDF 176 KB
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Tips for X-ray Users On Exporting NDF’s With No Loads Set To False
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Application Note 2007-10-18

Making the Most of Agilent Throughput Multiplier on Medalist In-Circuit Test Systems
Agilent Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

Application Note 2007-10-12

X-ray Test Users Utilize BOM Explorer to Change
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Application Note 2007-10-12

Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

Application Note 2007-10-11

Maximising Test Coverage with Agilent Medalist VTEP v2.0
This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

PDF PDF 227 KB
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Battery Drain Analysis Improves Mobile-Device Operating Time
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

PDF PDF 1.07 MB
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Life and Stability of the Agilent 5DX Sealed X-ray Tube
Agilent has developed a sealed ultra-high vacuum X-ray tube that provides stable output throughout a significantly long life.

Application Note 2007-01-22

PDF PDF 78 KB
Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.

Application Note 2006-08-08

AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Application Note 2006-04-16

PDF PDF 291 KB

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