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Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

PDF PDF 12.46 MB
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NIST Accredited Calibration of Power Sensors – Cal Lab
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.

Solution Brief 2012-07-02

Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.

Press Materials 2012-06-20

Advanced Design System Selected by Sivers IMA for Front-to-Back Silicon RFIC Implementation
Agilent announces that Sivers IMA, a leading European manufacturer of microwave products for telecommunications, industrial, and test and measurement applications, has selected ADS 2011 EDA platform for complete silicon-based RFIC/MMIC implementation.

Press Materials 2012-06-19

Agilent Extends Partnership with AMCAD to Include Nonlinear Modeling and Measurement Services
Agilent announces that its long-term relationship with AMCAD Engineering has been extended to include a technology partnership for services related to nonlinear design and measurement of new electronic devices.

Press Materials 2012-06-19

ON Semiconductor Offers High-Q™ IPD Process Design Kit for Advanced Design System Software
ON Semiconductor Corporation, a premier supplier of high performance silicon solutions for energy efficient electronics, announces the availability of a full front-to-back process design kit (PDK) for its High-Q™ Integrated Passive Device process. The PDK was developed for use with Agilent Technologies’ Advanced Design System (ADS) 2011 EDA software and enables both ON Semiconductor and Agilent customers to take full advantage of the industry’s most comprehensive RF and microwave design platform.

Press Materials 2012-06-18

IBM adds back-end PDK support for Agilent Technologies’ Advanced Design System Software
IBM announces the availability of a full front-to-back PDK for its popular SiGe BiCMOS 8HP technology. The PDK was developed for use with ADS 2011 and enables both IBM and Agilent customers to take full advantage of the industry’s most comprehensive RF and microwave design platform.

Press Materials 2012-06-18

Addressing VHT 802.11ac WLAN MIMO Design and Test Challenges
SystemVue is used with test equipment to evaluate design trade-offs of a 160 MHz 802.11ac WLAN two channel MIMO system.

Demo 2012-06-14

Product How To: Design a polar frequency discriminator
Polar frequency discriminators (PFD) are widely used in radar and direction-finding applications to determine the unknown frequency of incoming pulses. This article explains how to design the RF portion of a PFD, over a frequency range of 2 to 8 GHz, using Agilent’s ADS software.

Article 2012-06-08

How to design a high-performance scope: One team’s approach
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

Article 2012-06-07

Agilent Technologies Accelerates Early Wireless Design Verification with New Release of SystemVue
Agilent announces a new release of SystemVue, Agilent’s premier platform for designing communications systems.

Press Materials 2012-06-05

Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.

Press Materials 2012-06-04

Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.

Press Materials 2012-06-04

X-FAB Qualifies GoldenGate and Momentum Simulators for its 0.35 Micrometer CMOS Process Family
X-FAB Silicon Foundries, a leading foundry group for analog/mixed-signal semiconductor applications, announces support for GoldenGate RFIC circuit and Momentum 3D planar EM simulators for X-FAB's 0.35 micrometer modular analog/mixed-signal technology with RF capability and high-voltage extensions.

Press Materials 2012-06-04

GLOBALFOUNDRIES Qualifying GoldenGate and Momentum Simulators for its RF CMOS Processes
GLOBALFOUNDRIES announces support for Agilent's GoldenGate RFIC circuit and Momentum 3D planar electromagnetic (EM) simulators for its 65nm Low Power enhanced (LPe) RF CMOS process.

Press Materials 2012-06-04

Sorting Through EM Simulators
Matching an electromagnetic simulator to a particular application requires an understanding of the different simulation technologies at the heart of these software tools.

Article 2012-05-25

PDF PDF 3.50 MB
ENA series network analyzer based PIM and S-parameter measurement solution - QFS
This quick fact sheet introduces the key features of innovative solution with the ENA series that combines passive intermodulation (PIM) and S-parameter measurement capabilities.

Promotional Materials 2012-05-25

PDF PDF 608 KB
Cyntec Expands its Libraries Offering for Use with Advanced Design System 2011 Software Release
Cyntec Co., LTD, Hsinchu, announced the availability of an Advanced Design System (ADS) model library for Cyntec’s RF Chip inductors, CML0510 & CML0306 Series.

Press Materials 2012-05-15

RF Test Solutions – WinSoft
Military and Commercial RF Test Solutions from WinSoft and Agilent.

Solution Brief 2012-05-14

Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Agilent.

Solution Brief 2012-05-09

Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2012-05-09

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Designing Scalable 10G Backplane Interconnect Systems
This Paper presents techniques for design which significantly reduce modeling requirements for the design of high-speed backplanes in conjunction with advanced testing techniques which provide maximum channel characterization with the minimum amount of time.

Technical Overview 2012-05-05

PDF PDF 1.46 MB
Agilent EEsof Electronic System Level Design Flow with SystemVue
This video shows the Electronic System Level, or ESL, design flow from Agilent based on SystemVue -- the fastest way to design and validate challenging physical layer communications systems, where baseband and RF must work together.

Demo 2012-05-02

ADS Selected by Comtech EF Data for Satellite Communications, High-Frequency Power Amplifier Design
Agilent announces that Comtech EF Data, a subsidiary of Comtech Telecommunications Corp., has selected ADS for use in developing RF and microwave circuits for high-performance satellite communications systems.

Press Materials 2012-04-25

Genesys Brochure and Configuration Guide
12-page Genesys color brochure and configuration guide. Provides information to help with purchasing decisions and justifications.

Brochure 2012-04-24

PDF PDF 1.71 MB

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