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Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Notes d’application 2008-04-03

PDF PDF 119 KB
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)

Notes d’application 2007-11-28

PDF PDF 1.23 MB
Langues 
External waveguide mixing and millimeter wave measurements with PSA Spectrum Analyzers (AN 1485)

Notes d’application 2007-10-25

PDF PDF 1.17 MB
Langues 
Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver

Notes d’application 2007-08-15

PDF PDF 1.58 MB
Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Notes d’application 2007-05-09

PDF PDF 769 KB
Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer
This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.

Notes d’application 2007-03-31

PDF PDF 235 KB
Langues 
Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

Notes d’application 2006-11-29

PDF PDF 671 KB
Langues 
On-Wafer SOLT Calibration Using a 4-port, 20 GHz, PNA-L Network Analyzer
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually.

Notes d’application 2006-10-17

PDF PDF 2 MB
Langues 
Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

Notes d’application 2006-06-26

PDF PDF 168 KB
Langues 
Polyharmonic Distortion Modeling

Notes d’application 2006-06-01

PDF PDF 1.88 MB
Application Note on Tolerance In Surface Mount Varactor Diodes
A Note on the new feature (i.e. tolerance in the nominal capacitance) added to selected models in the Modelithics Non-Linear Diode (NLD) Model Library to emulate variations specified in data sheets.

Notes d’application 2006-05-25

PDF PDF 129 KB
4 Steps for Making Better Power Measurements (AN 64-4D)
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Notes d’application 2006-04-26

PDF PDF 995 KB
Langues 
Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis

Notes d’application 2006-04-05

PDF PDF 1.11 MB
Langues 
Introduction to the Fixture Simulator Function of the ENA Series RF Network Analyzers
This product note describes what the fixture simulator of the ENA Series is, and how it helps customers in various network measurement applications. The fixture simulator function includes de-embedding, embedding, and balanced measurements.

Notes d’application 2006-03-13

PDF PDF 899 KB
Langues 
Calibrating Standards for In-Fixture Device Characterization

Notes d’application 2005-06-17

PDF PDF 237 KB
8 Hints for Making and Interpreting EVM Measurements Application Note
This document provides tips on error vector magnitude (EVM) measurements. EVM provides insight into the performance of digital communications transmitters and receivers. EVM can pinpoint signal degradations.

Notes d’application 2005-05-20

PDF PDF 391 KB
ESA-E Series Spectrum Analyzer Performance Guide Using 89600 VSA Software
This application note characterizes the performance of the ESA-E series spectrum analyzers and the 89600 vector signal analysis software.

Notes d’application 2005-05-09

PDF PDF 680 KB
Langues 
Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems

Notes d’application 2005-04-05

PDF PDF 1.37 MB
Correlation of Simulation vs. Measurement in Frequency and Time Domain
For multi-gigahertz serial data link.

Notes d’application 2004-12-10

PDF PDF 1.24 MB
Wideband RF and BB Transmitter Modulation Analysis Using the 89600 VSA Software Application Note

Notes d’application 2004-12-10

PDF PDF 696 KB
Performance Spectrum Analyzer Series: Swept and FFT Analysis Application Note
This Product Note covers the measurement speed and other benefits of advanced signal processing in the new PSA Performance Spectrum Analyzer Series.

Notes d’application 2004-10-19

PDF PDF 286 KB
Langues 
81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2)
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Notes d’application 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1)
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Notes d’application 2004-10-12

PDF PDF
89441A Vector Signal Analyzer Phase Noise Measurements
The procedure takes you step-by-step through a phase noise measurement on the 89441A using two methods: direct spectrum and PM demodulation. No options are required to make this measurement.

Notes d’application 2004-07-26

PDF PDF 90 KB
Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).

Notes d’application 2004-06-01

PDF PDF 671 KB
Langues 

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