Technical Support

Test e Misura

Refine the List

By Application

All Applications
- RF & Microwave
  - RF & Microwave Design (15)
  - X-parameters (4)
  - Passive Intermodulation (PIM) (1)
  - Noise Figure Measurements (18)
  - Design & Test Integration (20)
  - Pulsed-RF Measurements (12)
  - EMI & EMC (9)
  - Signal Monitoring, Geolocation (1)
  - Impedance (30)
  - ESL Design (16)
  - Phase-Locked Loops (10)

By Type of Content

Document Library
- Application Notes
  - Application Note (210)
  - Analysis Tool (1)
By Product Category
- Oscilloscopes, Analyzers, Meters (139)
  - Oscilloscopes (2)
  - Spectrum Analyzers (Signal Analyzers) (55)
  - Network Analyzers (33)
  - EMI/EMC, Phase Noise, Physical Layer Test Systems (28)
  - Digital Multimeters (DMM) (1)
  - Power Meters & Power Sensors (7)
  - Frequency Counter Products (18)
  - Noise Figure Analyzers & Noise Sources (10)
  - LCR Meters & Impedance Measurement Products (30)
  - Digitizers (1)
  - Dynamic Signal Analyzers, Materials Measurement (5)
  - Parameter & Device Analyzers, Curve Tracer (3)
- Generators, Sources, Supplies (23)
  - Signal Generators (Signal Sources) (14)
  - Function / Arbitrary Waveform Generators (2)
  - Pulse Generator Products (6)
  - Data Generators & Analyzers (2)
  - DC Power Supplies (5)
  - AC Power Sources / Power Analyzers (2)
- Software (58)
  - Agilent EEsof EDA Software (40)
  - Application Software for Instruments (20)
  - 89600 VSA Software (5)
- PXI, AXIe, DAQ & Modular Solutions (7)
  - PXI Products & Solutions (1)
  - Data Acquisition Modules - DAQ (1)
  - VXI Products & Solutions (5)
- Additional Test & Measurement Products (38)

1-25 of 211

EM Insights Series The EM Insights series is a collection of EM applications from Agilent EEsof EDA. Application Note 2013-05-06
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method. Application Note 2013-04-12	PDF 1.36 MB
Electronic System-Level (ESL) Applications Center Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas. Application Note 2013-04-02
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer. Application Note 2013-03-28	PDF 8.17 MB
Equivalent Circuit Based Models For Surface Mount RLC Components Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components. Application Note 2013-02-06
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 This application note discusses the unique challenges involved in minimizing noise figure. Application Note 2013-01-31	PDF 2.54 MB
Simulating Envelope Tracking with Advanced Design System This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design. Application Note 2012-11-22	PDF 2.30 MB
Successful Modulation Analysis in 3 Steps This application note presents a planned measurement & troubleshooting sequence consisting of 3 steps: (1) Frequency, frequency & time, (2) Basic digital mod. analysis, and (3) Advanced digital mod. analysis. Application Note 2012-11-21	PDF 3.55 MB Languages English \| 2012-11-21 \| PDF 3.55 MB 日本語 \| 2011-04-28 \| PDF 2.90 MB
Vector Signal Analysis Basics This application note serves as a primer on vector signal analysis. It covers VSA measurement concepts and theory of operation, general vector-modulation analysis and, digital-modulation analysis. Previously known as AN150-15. Application Note 2012-11-21	PDF 4.02 MB Languages English \| 2012-11-21 \| PDF 4.02 MB 中文（简体） \| 2011-02-17 \| PDF 2.80 MB
Creating C++ Algorithms in SystemVue Using Model Builder The SystemVue C++ Model Builder interface provides a powerful mechanism for exploring signal processing algorithms for communications system design. Application Note 2012-11-14	PDF 1.53 MB
Impedance and Network Analysis Application List Application Note This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers. Application Note 2012-10-30	PDF 1.11 MB
Noise Figure Uncertainty Calculator The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance. Analysis Tool 2012-10-18
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools. Application Note 2012-10-15	PDF 1.03 MB Languages English \| 2012-10-15 \| PDF 1.03 MB 中文（简体） \| 2011-09-14 \| PDF 1.03 MB
Virtual Flight Testing of Radar System Performance Agilent SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money. Application Note 2012-09-21	PDF 633 KB
Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow. Application Note 2012-09-21	PDF 467 KB Languages English \| 2012-09-21 \| PDF 467 KB 日本語 \| 2013-02-15 \| PDF 415 KB
FPGA Prototyping Using Agilent SystemVue This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing. Application Note 2012-08-30	PDF 3.37 MB
Spectrum and Signal Analysis Pulsed RF Application Note 150-2 This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra. Application Note 2012-07-05	PDF 12.46 MB Languages English \| 2012-07-05 \| PDF 12.46 MB 日本語 \| 2006-05-08 \| PDF 8.48 MB
Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer. Application Note 2012-05-09	HTML
Testing next-generation optical systems with simulated OFDM signals The described measurement solution with SystemVue and M8190A AWG is flexible enough to handle a wide range of modulation schemes, channel spacings, spectral widths and detection methods. Application Note 2012-02-19	PDF 600 KB
Mixed-Signal Integration Challenges in Complex Radar Systems Using A Common Measurement Platform to Address the Mixed-Signal Integration Challenges in Complex Radar Systems presents an alternate design and test approach for today’s complex radar systems. Application Note 2012-02-10	PDF 1.99 MB
Using Agilent SystemVue to Create Realistic Scenarios for Radar and EW Applications Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test. Application Note 2012-01-24	PDF 3.01 MB
10 Hints for Making Successful Noise Figure Measurements (AN 57-3) This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses. Application Note 2011-12-21	PDF 2.03 MB Languages English \| 2011-12-21 \| PDF 2.03 MB 日本語 \| 2001-07-30 \| PDF 1.33 MB
Average Power Sensor Measurement Uncertainty Calculator Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H) Application Note 2011-11-30	XLS 76 KB
Load Pull + NVNA = Enhanced X-Parameters for PA Designs With high mismatch and technology-independent large-signal device models. Application Note 2011-09-08	Languages English 中文（简体）
Solutions for Ultra-Wideband Radar System Design This “Solutions for Ultra-Wideband Radar System Design” application note explains how to integrate design with ultra-wideband test for flexible radar verification. Application Note 2011-06-24	PDF 1.40 MB

1 2 3 4 5 6 7 8 9 Next

Technical Support

Test e Misura

Refine the List

By Application

By Type of Content

By Product Category

1-25 of 211

Prodotti e Servizi

Supporto tecnico

Applicazioni & Soluzioni

Informazioni su Agilent