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Agilent EEsof EDAユーザ向けメールマガジン -- しみゅレター
アジレントEDAソリューションの技術情報やアプリケーション情報を定期的にお知らせするEメールニュースレターです。

ニュースレター 2013-04-17

EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

ブローシャ 2013-04-09

PDF PDF 128 KB
Agilent Ships Newest SPICE Model Extraction and Qualification Software
Agilent announces shipment of the latest release of its industry-leading SPICE model extraction tool, Model Builder Program, and SPICE qualification tool, Model Quality Assurance.

プレス資料 2013-03-13

Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

プレス資料 2013-03-12

Agilent　IC-CAP デバイス・モデリング・ソフトウェア
半導体デバイス・モデリング用高精度パラメータ抽出

技術概要 2013-03-06

PDF PDF 1.72 MB
言語 
Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

記事 2013-01-09

Agilent Technologies Unveils New IC-CAP Platform for Device Characterization and Modeling
Agilent announces the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP).

プレス資料 2012-12-18

MOS-AK/GSA Modeling Working Group Holds Winter Workshop in San Francisco
Experts Share Insight on Compact Device Modeling with Emphasis on Simulation-Aware Models.

プレス資料 2012-12-12

Pulsed Measurement of Active Device IV Characteristics and S-Parameters - Maury Microwave
Pulsed Measurement of Active Device IV Characteristics and S-Parameters from Maury Microwave and Agilent

ソリューション概要 2012-12-04

Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

記事 2012-11-28

PDF PDF 6.08 MB
X-Parameter Design Simulation Models - Modelithics
X-Parameter Design Simulation Models from Modelithics and Agilent.

ソリューション概要 2012-10-02

Agilent Technologies Ships New Software for Generating and Qualifying SPICE Models
Agilent today announced shipment of its first release of the industry-leading SPICE modeling tools it obtained through the acquisition of Accelicon Technologies in February.

プレス資料 2012-08-23

Agilent Extends Partnership with AMCAD to Include Nonlinear Modeling and Measurement Services
Agilent announces that its long-term relationship with AMCAD Engineering has been extended to include a technology partnership for services related to nonlinear design and measurement of new electronic devices.

プレス資料 2012-06-19

Model Builder Program （MBP）

ブローシャ 2012-06-13

PDF PDF 2.86 MB
Model Quality Assurance （MQA）

ブローシャ 2012-06-13

PDF PDF 3.20 MB
Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.

プレス資料 2012-06-04

Agilent Announces Shipment of the IC-CAP 2012 Platform for Device Characterization and Modeling
Agilent announces shipment of the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP) for 2012.

プレス資料 2012-03-02

Agilent Completes Acquisition of Accelicon Technologies’ Solutions for Semiconductor Device Modeling
Agilent Technologies announced that Accelicon Technologies’ software solutions and technology for device-level modeling and validation in the electronics industry are now part of Agilent.

プレス資料 2012-02-21

Pulsed Measurement of IV Characteristics and RF Parameters – Auriga Microwave
Pulsed Measurement of IV Characteristics and RF Parameters from Auriga Microwave and Agilent

ソリューション概要 2012-02-10

Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.

ブローシャ 2011-08-03

PDF PDF 1.92 MB
Agilent Technologies Ships Latest IC-CAP Platform for DC and RF Device Characterization and Modeling
Software improves modeling flow with link between measurement and extraction

プレス資料 2011-05-10

Automated Measurement with IC-CAP
This application note describes a seamless solution for automated measurement and parameter extraction with Agilent IC-CAP

アプリケーション・ノート 2011-01-10

PDF PDF 1.42 MB
言語 
Recommended Modeling Configurations for Device Modeling
IC-CAP Recommended Modeling Configurations for Device Modeling

構成ガイド 2010-09-23

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

プレス資料 2010-08-19

Compact Hierarchical Bipolar Transistor Modeling with HiCUM
An international series on advances in solid state electronics and technology by Michael Schroter and Anjan Chakravorty.

プロモーション資料 2010-08-01

PDF PDF 330 KB

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