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How to design a high-performance scope: One team’s approach
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

Article 2012-06-07

Sorting Through EM Simulators
Matching an electromagnetic simulator to a particular application requires an understanding of the different simulation technologies at the heart of these software tools.

Article 2012-05-25

PDF PDF 3.50 MB
Addressable Test Structures for MOSFET Variability Analysis
This IEEE paper presents a 4-bit addressable array-based test structure with a centre reference transistor allowing evaluation of variability in advanced technologies.

Article 2012-03-19

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

PDF PDF 585 KB
Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.

Article 2011-06-02

PDF PDF 1.04 MB
The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.

Article 2011-04-24

PDF PDF 1.61 MB
An Innovative and Integrated Approach to III-V Circuit Design
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

PDF PDF 360 KB
AMI models: What, why and how?
EE Times Design Article written by Sanjeev Gupta, Jose Luis Pino and Amolak Badesha of Agilent EEsof EDA.

Article 2010-10-18

Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters

Article 2009-10-09

PDF PDF 1.92 GB
3D EM Simulator is Integrated with ADS to Lower the Cost of Design
With EMPro 2009, high performance time domain (FDTD) and frequency domain (FEM) EM analysis is integrated with all the other Advanced Design System (ADS) capabilities

Article 2009-06-14

PDF PDF 195.40 KB
Fast Multitone Analysis of RF Transceivers
This Article written by George Estep, Pete Johnson and Vladimir Veremey describes Fast Multitone analysis of RF Transceivers in detail.

Article 2009-03-24

PDF PDF 1.74 MB
Signal Integrity Simulation of PCI Express Gen 2 Channel
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.

Article 2009-03-23

PDF PDF 1.81 MB
Addressing the Design and Verification Challenges of LTE
Wireless Design magazine article on testing LTE.

Article 2009-02-25

PDF PDF 4.59 MB
What Every RF Engineer Should Know: Power Amplifiers
Feature story by Janine Love.

Article 2009-01-12

Validating the Physical and Protocol Layers in DDR Memory Interfaces

Article 2009-01-06

Eye-Diagram Analysis Speeds DDR SDRAM Validation

Article 2009-01-06

Creating High-Performance SDR Architectures
How to co-design RF architectures together with baseband signal processing to create high performance and flexible SDR architectures that can achieve the critical performance specifications necessary in the operational environment.

Article 2008-11-25

PDF PDF 806 KB
A Constant Mismatch Analysis of Power RF Transistors using EDA tools
This Article wirtten by John Pritiskutch and Craig Rotay (STMicroelectronics) describes a Constant Mismatch Analysis of Power RF Transistors using EDA tools.

Article 2008-06-01

PDF PDF 5.90 MB
MMIC Design: Speed to Market with the Lowest Cost and Highest Yield
This Article by Jack Sifri (Agilent Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB
Advanced Design System Connected Solutions for Radar and EW Systems
This article will explain the benefits of combining a simulated ADS radar model with physical test equipment to create what is referred to as a connect solution.

Article 2008-01-28

PDF PDF 799 KB
Simplify DDR Validation with SI Methods

Article 2008-01-06

Productivity by Design: ADS 2008 Reduces Steps to Simulation and Verification
This Article by How-Siang Yap discusses the considerations for using ADS 2008 to double designer productivity when performing common design and development tasks.

Article 2008-01-01

PDF PDF 508 KB
Testing HSUPA devices
By: Jeanne Fightmaster, Agilent Technologies Published with permissions of EETimes Asia

Article 2007-11-16

PDF PDF 404 KB
New measurement option expands Agilent’s leadership in noise figure analysis
There are many choices today for performing noise figure measurements of LNAs and transistors. The new PNA-X source-corrected method offers a technique that provides the most accurate noise figure measurements available today.

Article 2007-11-01

PDF PDF 1.05 MB

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