Discutez avec un expert

Technical Support

Test et mesure électronique

Find by Product Model Number: Examples: 34401A, E4440A

1-11 of 11

Sort:
34945A, L4445A & L4490A/L4491A Configuration Guide
This configuration guide includes Agilent’s new L4490A and L4491A RF Switch Platforms and adds increased emphasis on selection and configuration of 34945A, L4445A, and L4490A/L4491A - based systems.

Configuration Guide 2012-08-30

LXI Functional Test - LXinstruments
LXI Functional Test Solutions from LXinstruments and Agilent.

Brève de solutions 2012-06-22

LXI Brochure
The Agilent LXI Brochure shows you how to open the door to simpler system creation.

Brochure 2011-06-16

Using IVI For Your Instrument Driver
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Application Note 2007-05-10

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Application Note 2006-05-03

Defining three classes of LAN eXtensions for Instrumentation (LXI)
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.

Application Note 2006-01-12