技术支持
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Testing Radar and EW Systems for the Real-World
The solutions described in this Microwave Journal article do more than address a wide range of present and future radar systems: They also help overcome organizational hurdles.
文章 2012-07-12 |
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Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.
期刊 2011-12-04 |
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Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.
文章 2011-06-02 |
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The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.
文章 2011-04-24 |
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Mindspeed Technologies, Inc. "LTE and WiMAX™ Layer 1 Compliance using SystemVue"
Mindspeed, a leading IC provider to the wireless communications infrastructure market, uses Agilent SystemVue to bring measurement-grade verification inside the baseband design process.
案例分析 2010-04-14 |
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Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3
文章 2010-03-25 |
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1-GHz Digital Channel Multiplexer for Satellite Outdoor Unit Based on a 65-nm CMOS Transceiver
STMicroelectronics needed to rapidly evaluate and prototype real-world effects on a high-performance wideband PHY architecture for satellite communications and used Agilent SystemVue from Agilent EEsof EDA.
案例分析 2009-11-17 |
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Using a design-to-test capability for LTE MIMO
Article written for RF DesignLine by Agilent experts explains how system-level simulation helps engineers gain valuable insight into design sensitivities of LTE MIMO systems.
案例分析 2009-07-10 |
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Flexible Software-Defined Test Instruments
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.
文章 2006-11-01 |
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