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測試與量測

The Proposed IEEE Test Standards There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend 專文 2010-10-20	PDF 2.83 MB
Flash Programming - Agilent Utility Card versus Deep Serial Memory Case Study This case study compares flash programming performances of the Agilent Medalist i3070 Series 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne ICT solution. 案例研究 2010-07-07	PDF 155 KB
Flash programming with the Agilent Utility Card - Successful Implementation This case study details the successful implementation of flash programming with the Agilent utility card in the manufacturing environment. 案例研究 2010-06-28	PDF 144 KB