Technical Support: Test & Messtechnik

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Rapid Characterization of Elastic Modulus Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation. Application Note 2012-03-22	PDF 146 KB
Determination of Critical Tearing Energy of Polymer Films Overview of critical tearing energy for two commercially available polymer tapes that are measured from trouser-tear tests. The capability of measuring small loads, along with the high force resolution, enabled us to capture the variations in force during tearing of thin polymer films Application Note 2012-03-22	PDF 203 KB
SINAD measurements Using the Agilent U8903A Audio Analyzer - Application Note This document covers the use of the Agilent U8903A audio analyzer in characterizing radio receiver sensitivity by means of measuring SINAD, an audio quality value that is usually used to specify the RF sensitivity. Application Note 2012-03-22	PDF 760 KB
Tensile Stress-Strain Response of Small Diameter Electrospun Fibers Overview of characterization of tensile stress-strain behavior of small diameter electrospun fibers of PCL using the Agilent UTM T150 Application Note 2012-03-20	PDF 211 KB
USB 3.0 Protocol Testing with Active Error Insertion Application Note Speed up design and verification of USB designs using the U4612A Jammer Application Note 2012-03-19	PDF 3.51 MB
Simplify Complex High-speed Multichannel Acquisition Systems in Big Physics Experiments-Application This application note overview describes the use of Agilent modular products for high-speed multichannel acquisition systems in big physics experiments. Application Note 2012-03-19	PDF 651 KB Sprachen English \| 2012-03-19 \| PDF 651 KB 中文（简体） \| 2012-03-19 \| PDF 516 KB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study Application Note 2012-03-13	PDF 389 KB
Implementing Parallel Voltage Measurements in Functional Test of Automotive ECUs White Paper This paper examines the typical test system configuration of a conventional automotive ECU test method and compares that with parallel test methods. Application Note 2012-03-12	PDF 1.44 MB Sprachen English \| 2012-03-12 \| PDF 1.44 MB 中文（简体） \| 2012-04-30 \| PDF 710 KB
S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note Discusses using de-embedding tools to gain virtual access to difficult measurement points Application Note 2012-03-11	PDF 2.09 MB Sprachen English \| 2012-03-11 \| PDF 2.09 MB 中文（简体） \| 2012-03-11 \| PDF 2.09 MB 한국어 \| 2012-03-11 \| PDF 2.09 MB
Accelerate interference detection and identification in wireless devices. This solution provides capture of transient errors in real RF environments; then the ability to investigate the nature and cause in a controlled lab environment. This is an application note overview. Application Note 2012-03-09	PDF 819 KB Sprachen English \| 2012-03-09 \| PDF 819 KB 中文（简体） \| 2012-03-09 \| PDF 458 KB 日本語 \| 2012-04-10 \| PDF 1.15 MB
Transforming Oscilloscope Acquisitions for De-Embedding, Embedding and Simulating Channel Effects Covers fundamentals of understanding the design parameters, the various methods of data acquisition and implementing the results into a first-class design Application Note 2012-03-05	PDF 2.33 MB Sprachen English \| 2012-03-05 \| PDF 2.33 MB 中文（简体） \| 2012-03-05 \| PDF 2.33 MB 한국어 \| 2012-03-05 \| PDF 2.33 MB
PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements. Application Note 2012-03-05	PDF 3.38 MB Sprachen English \| 2012-03-05 \| PDF 3.38 MB 日本語 \| 2009-10-29 \| PDF 2.89 MB
S-parameter Series: S-parameter Requirements for Oscilloscope De-Embedding Applications A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters Application Note 2012-03-02	PDF 2.13 MB Sprachen English \| 2012-03-02 \| PDF 2.13 MB 中文（简体） \| 2012-03-02 \| PDF 2.13 MB 한국어 \| 2012-03-02 \| PDF 2.13 MB
N432A Measurement Uncertainty Calculator Measurement Uncertainty Calculator for the N432A Thermistor Power Meter. Analysis Tool 2012-03-01	XLS 137 KB
Using .NET Methods to Add Functionality to IVI-COM Drivers This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming. Application Note 2012-03-01	PDF 335 KB Sprachen English \| 2012-03-01 \| PDF 335 KB 中文（简体） \| 2012-03-01 \| PDF 335 KB
S-parameter Series: Using the Time-Domain Reflectometer Application Note Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding Application Note 2012-03-01	PDF 3.69 MB Sprachen English \| 2012-03-01 \| PDF 3.69 MB 中文（简体） \| 2012-03-01 \| PDF 3.69 MB 한국어 \| 2012-03-01 \| PDF 3.69 MB
Identifying an Electrical Circuit Using Agilent Wireless Remote Connectivity Solution Case study on how to use Agilent U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC to identify electrical circuit. Application Note 2012-02-27	PDF 183 KB Sprachen English \| 2012-02-27 \| PDF 183 KB Português \| 2012-05-07 \| PDF 232 KB
Minimum Required Sample Rate for a 1-GHz Bandwidth Oscilloscope We will test a 1-GHz oscilloscope by capturing some high frequency analog and high-speed digital signals, then follow-up these tests with the supporting theory behind it to understand sample rate. Application Note 2012-02-27	PDF 579 KB
Accelerate Development of Next Generation 802.11ac Wireless LAN Transmitters-Overview This application note overview describes how to accelerate the development of next generation 802.11ac wireless LAN transmitters. Application Note 2012-02-23	PDF 616 KB Sprachen English \| 2012-02-23 \| PDF 616 KB 中文（简体） \| 2012-02-23 \| PDF 864 KB 日本語 \| 2012-03-30 \| PDF 904 KB
Testing next-generation optical systems with simulated OFDM signals The described measurement solution with SystemVue and M8190A AWG is flexible enough to handle a wide range of modulation schemes, channel spacings, spectral widths and detection methods. Application Note 2012-02-19	PDF 600 KB
Using PrecisionProbe Software on the Infiniium 9000 Series Oscilloscopes This application note introduces an easier and quicker solution for addressing the loss due to the probing system and its impact on oscilloscope measurements. Application Note 2012-02-13	PDF 614 KB
Mixed-Signal Integration Challenges in Complex Radar Systems Using A Common Measurement Platform to Address the Mixed-Signal Integration Challenges in Complex Radar Systems presents an alternate design and test approach for today’s complex radar systems. Application Note 2012-02-10	PDF 1.99 MB
Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers. Application Note 2012-02-08	PDF 506 KB Sprachen English \| 2012-02-08 \| PDF 506 KB 中文（简体） \| 2012-06-08 \| PDF 1.83 MB
Wireless LAN at 60 GHz - IEEE 802.11ad Explained - Application Note This application note introduces the new WLAN testing technology of 802.11ad. 802.11ad provided up to 7Gbps throughput using approximately 2GHz of spectrum at 60GHz over a short range. Application Note 2012-02-07	PDF 924 KB
6 Hints for Better SATA and SAS Measurements These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges. Application Note 2012-02-02	PDF 1.59 MB

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