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移除所有細分251-275 / 738
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Signal Integrity Simulation of PCI Express Gen 2 Channel
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.
專文 2009-03-23 |
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1.81 MB
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Achieving a 30 Percent Reduction in Test Time by Migrating to the MXA Signal Analyzer
This article examines Skyworks’ real-world test strategy for characterizing power amplifiers using multi-test platform (MTP) testers.
專文 2009-03-18 |
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255 KB
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Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS).
案例研究 2009-03-12 |
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196 KB
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In-Circuit Test Channel Partner Interview Series: Everett Charles Technology
The channel partners series began with an exploration of programming houses. It is not that we venture into the Fixture house side of the business. Please enjoy this extension of the article series.
專題報導 2009-03-10 |
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94 KB
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In-Circuit Test Channel Partner Interview Series: QXQ, Inc.
This article is continues to educate on fixture houses in relation to in-circuit test as the article series explores fixturing houses that Agilent works regularly with. This article features QXQ, Inc.
專題報導 2009-03-04 |
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94 KB
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In-Circuit Test Channel Partner Interview Series: TestingHouse Inc.
his article is the fourth in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features TestingHouse Inc., from a programming house perspective.
專題報導 2009-03-03 |
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95 KB
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In-Circuit Test Channel Partner Interview Series: Circuit Check, Inc.
Circuit Check, Inc. provides comment in the editorial series serving to educate our in-circuit test contacts about the variety of fixture houses that Agilent has partnerships with.
專題報導 2009-02-28 |
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91 KB
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Addressing the Design and Verification Challenges of LTE
Wireless Design magazine article on testing LTE.
專文 2009-02-25 |
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4.59 MB
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Agilent Division Delivers Early Test Solutions for LTE User Equipment
Agilent SystemVue greatly accelerates time-to-market for LTE products.
案例研究 2009-02-20 |
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282 KB
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EDN - Simulation gets speed, capacity boost
Electronic Design, Strategy, News (EDN) feature story by Rick Nelson.
案例研究 2009-01-22 |
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Volumetric Paste Measurement using Solder Paste Inspection (SPI)
Written by : Jeff Bishop, Product Marketing Engineer, Agilent Technologies. The online recording discusses the techniques used for 3D paste analysis, accuracy of the measurements, and how these tools can be integrated into production affectively.
專題報導 2009-01-20 |
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The Fifth Harmonic: Tradeoffs Between Sampling and Real-Time Oscilloscopes
When determining the required system bandwidth some vendors will use a “fifth harmonic” rule of thumb; however it is important to understand typical conditions at the receiver to accurately determine the amount of bandwidth you will need.
專文 2009-01-19 |
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Offering Merges Design and Test
Agilent featured in Wireless Systems Design magazine article
專文 2009-01-16 |
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Improving DQPSK Receiver Design for Satcom Apps
Reprint of technical article in Comms Design, 1/2003
專文 2009-01-16 |
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What Every RF Engineer Should Know: Power Amplifiers
Feature story by Janine Love.
專文 2009-01-12 |
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Concepts of Orthogonal Frequency Domain Modulation (OFDM)
專文 2009-01-07 |
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Validating the Physical and Protocol Layers in DDR Memory Interfaces
專文 2009-01-06 |
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Eye-Diagram Analysis Speeds DDR SDRAM Validation
專文 2009-01-06 |
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A Year in Wireless (WDD)
From the Wireless Design & Development Board Member's Point of View: What Caught Them by Surprise in 2008 and the Changes to Come in 2009.
案例研究 2009-01-02 |
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Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed
專文 2009-01-01 |
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Is the 5th Harmonic Still Useful for Predicting Data Signal Bandwidth?
This article, published in High Frequency Electronics, compares using the 5th harmonic to using the system rise/fall times to determine the required bandwidth for your system. The article begins on page 18.
專文 2009-01-01 |
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Testing Challenges of SDR's
A new modeling methodology combines FPGAs and detailed circuit-level modeling in a design-to-test flow.
案例研究 2008-12-31 |
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Testing LTE
Design simulation can be useful in addressing LTE design and verification challenges but requires consideration in selecting the appropriate model abstraction for the given phase of the design cycle.
案例研究 2008-12-31 |
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What Every RF Engineer Should Know: OFDM & WiMax
Feature story by Janine Love.
案例研究 2008-12-27 |
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In-Circuit Test Channel Partner Interview Series: Masterpiece Engineering
This article is the third in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features Masterpiece Engineering, from a programming house perspective.
專題報導 2008-12-16 |
PDF
106 KB
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