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1-25 of 2660

Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR Application Note 2013-05-21	PDF 2.13 MB
Creating Custom Multitone with Agilent U8903A Audio Analyzer - Application Note This application note discusses how to create custom multitones with the U8903A audio analyzer. Multitones are widely used in modern audio measurements to test consumer and professional audio devices. Application Note 2013-05-16	PDF 949 KB
Low Frequency RFID Tag Characterization - Application Note This application note introduces how to measure the resonance frequency of an RFID tag with the Agilent N9322C basic spectrum analyzer (BSA) easily. Application Note 2013-05-16	PDF 3.59 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing. Application Note 2013-05-10	PDF 2.02 MB Languages English \| 2013-05-10 \| PDF 2.02 MB 日本語 \| 2010-01-14 \| PDF 3.64 MB
GNSS Technologies and Receiver Testing - Application Note This application note provides information on GNSS technologies including GPS, Compass, Beidou, Galileo, and Glonass, along with the related receiver test challenges and solutions. Application Note 2013-05-08	PDF 3.63 MB
Evaluating High-Resolution Oscilloscopes - Application Note This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode Application Note 2013-05-07	PDF 682 KB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network. Application Note 2013-05-07	PDF 2.90 MB
EM Insights Series The EM Insights series is a collection of EM applications from Agilent EEsof EDA. Application Note 2013-05-06
Radar Test Measurements - Application Note This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems. Application Note 2013-04-30	PDF 4.68 MB
Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges. Application Note 2013-04-29	PDF 1.32 MB Languages English \| 2013-04-29 \| PDF 1.32 MB Pусский \| 2011-09-07 \| PDF 1.07 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR. Application Note 2013-04-24	PDF 2.02 MB
Increasing Manufacturing Throughput of Automotive Controllers - Application Note This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test. Application Note 2013-04-18	PDF 783 KB
Overvoltage Protection in Power Supplies - Application Note This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications Application Note 2013-04-18	PDF 832 KB
How to Read Your DC Power Supply's Data Sheet - Application Note Understanding how to sort through key power supply specifications in a data sheet can simplify product selection. Application Note 2013-04-16	PDF 325 KB
Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers - This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer. Application Note 2013-04-16	PDF 472 KB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method. Application Note 2013-04-12	PDF 1.36 MB
Radar Distance Test to Airborne Planes - Application Note Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry. Application Note 2013-04-11	PDF 904 KB
Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers Application Note 2013-04-08	PDF 188 KB
PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis Application Note 2013-04-08	PDF 736 KB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test. Application Note 2013-04-05	PDF 748 KB
Basics of Measuring the Dielectric Properties of Materials - Application Note The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here. Application Note 2013-04-03	PDF 3.60 MB Languages English \| 2013-04-03 \| PDF 3.60 MB 日本語 \| 2012-05-14 \| PDF 725 KB
Power Essentials Resource Kit A collection of technical content and tools to help you get the most out of your bench or system power supply. Application Note 2013-04-03
Electronic System-Level (ESL) Applications Center Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas. Application Note 2013-04-02
Oscilloscope Selection Tip 8: Serial Bus Applications - Application Note Tip 8: Select a scope that can trigger on and decode serial buses to help you debug your designs faster. Application Note 2013-04-02	PDF 881 KB
Oscilloscope Selection Tip 3: Acquisition Memory Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution. Application Note 2013-04-02	PDF 682 KB Languages English \| 2013-04-02 \| PDF 682 KB 中文（简体） \| 2012-02-01 \| PDF 37 KB

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