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Low Frequency RFID Tag Characterization - Application Note
This application note introduces how to measure the resonance frequency of an RFID tag with the Agilent N9322C basic spectrum analyzer (BSA) easily.
Notes d’application 2013-05-16 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Notes d’application 2013-05-10 |
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GNSS Technologies and Receiver Testing - Application Note
This application note provides information on GNSS technologies including GPS, Compass, Beidou, Galileo, and Glonass, along with the related receiver test challenges and solutions.
Notes d’application 2013-05-08 |
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Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.
Notes d’application 2013-05-07 |
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EM Insights Series
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.
Notes d’application 2013-05-06 |
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Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.
Notes d’application 2013-04-30 |
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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.
Notes d’application 2013-04-29 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
Notes d’application 2013-04-24 |
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Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test.
Notes d’application 2013-04-18 |
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Overvoltage Protection in Power Supplies - Application Note
This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications
Notes d’application 2013-04-18 |
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How to Read Your DC Power Supply's Data Sheet - Application Note
Understanding how to sort through key power supply specifications in a data sheet can simplify product selection.
Notes d’application 2013-04-16 |
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Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer.
Notes d’application 2013-04-16 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
Notes d’application 2013-04-12 |
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Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.
Notes d’application 2013-04-11 |
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PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note
This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis
Notes d’application 2013-04-08 |
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Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers
Notes d’application 2013-04-08 |
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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
Notes d’application 2013-04-05 |
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Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
Notes d’application 2013-04-03 |
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Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.
Notes d’application 2013-04-03 |
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Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.
Notes d’application 2013-04-02 |
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Oscilloscope Selection Tip 3: Acquisition Memory
Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution.
Notes d’application 2013-04-02 |
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Oscilloscope Selection Tip 8: Serial Bus Applications - Application Note
Tip 8: Select a scope that can trigger on and decode serial buses to help you debug your designs faster.
Notes d’application 2013-04-02 |
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Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.
Notes d’application 2013-04-01 |
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CAN Eye-diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.
Notes d’application 2013-04-01 |
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Making Reflection Measurements - Application Note
The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement.
Notes d’application 2013-03-29 |
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