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README.txt
README for Desktop EasyEXPERT
A.05.03.2013.0124
Release Notes 2013-03-15 |
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N2744A T2A Probe Interface Adapter - Data Sheet
The N2744A T2A interface adapter enables selected TekProbe® interface level II probes to be used with Agilent oscilloscopes with the AutoProbe interface.
Data Sheet 2013-03-14 |
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Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
A new era of data-center infrastructure enabling cloud computing, big data and analysis is driving the development of new high-speed data transfer standards such as 100-Gb Ethernet and 32-Gb Fibre Channel.
Press Materials 2013-03-14 |
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Making Stimulus/Response Measurements - Application Note
The N9322C basic spectrum analyzer is a dual use RF analyzer, which performs frequency-selective power analysis and component-level characterization when used with the optional tracking generator.
Application Note 2013-03-14 |
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Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.
Application Note 2013-03-14 |
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N5392A Ethernet Electrical Performance Validation and Compliance Software - Data Sheet
The Agilent Technologies N5392A Ethernet electrical performance validation and compliance software for Infiniium 54830 and 54850 Series oscilloscopes provides you with a fast and easy way to verify and debug your 1000Base-T, 100Base-TX and 10Base-T Ethernet designs. The Ethernet electrical test software
Data Sheet 2013-03-14 |
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U7248A High Speed Inter-Chip (HSIC) Electrical Test Software Infiniium Oscilloscopes - Data Sheet
The U7248A HSIC compliance test software provides the first automated HSIC compliance test application for a real time oscilloscope. This software provides a fast, reliable way to verify HSIC devices.
Data Sheet 2013-03-14 |
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N4951B-D17/-D32 Preliminary Data Sheet
The N4951B-D17/-D32 is a 4 tap de-emphasis pattern generator to counteract the effects of frequency dependent losses in a channel.
Data Sheet 2013-03-13 |
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Agilent Ships Newest SPICE Model Extraction and Qualification Software
Agilent announces shipment of the latest release of its industry-leading SPICE model extraction tool, Model Builder Program, and SPICE qualification tool, Model Quality Assurance.
Press Materials 2013-03-13 |
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Agilent Technologies Updates Reference-Class Multiwavelength Meter
Agilent Technologies Inc. (NYSE: A) today introduced the Agilent 86122C multiwavelength meter, the newest member of its line of wavelength meters.
Press Materials 2013-03-13 |
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U1177A IR-to-Bluetooth Adapter - Data Sheet
This datasheet presents the first IR-to-Bluetooth device that is compatible across all Agilent handheld digital multimeters.
Data Sheet 2013-03-13 |
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How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.
Application Note 2013-03-13 |
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Physical Layer Test System (PLTS) 2012 - Technical Overview
The PLTS software, with rapid crosstalk analysis and customizable device configuration mapping, makes multiple board turns a thing of the past. This technical overview covers basic information such as why physical layer testing is important, advanced signal integrity topics, and how the software guides the user through hardware setup and calibration, and controls the data acquisition.
Technical Overview 2013-03-13 |
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87415A ,87400A Microwave Amplifiers Technical Overview
A Technical Overview on 87415A ,87400A Microwave Amplifiers.
Technical Overview 2013-03-13 |
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Agilent Technologies Introduces High-Sensitivity Multiport Optical Power Meters
The two- channel N7747A and four-channel N7748A bring the industry-leading sensitivity of the 81634B sensor module to the compact multichannel N77 platform, with updated memory size and data-transfer speed.
Press Materials 2013-03-13 |
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Quick Install and License Setup
Quick installation and license setup information for MQA 2013.01, Windows.
Installation Manual 2013-03-12 |
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Peak Power Anlyzer 1.2.2.3 Patch readme
Peak Power Anlyzer 1.2.2.3 Patch readme.
Help File 2013-03-12 |
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Product Documentation
Agilent EEsof EDA Model Quality Assurance (MQA) Product Documentation, 2013.01.
Reference Guide 2013-03-12 |
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Quick Install and License Setup
Quick installation and license setup information for MBP 2013.01, Linux.
Installation Manual 2013-03-12 |
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In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.
Application Note 2013-03-12 |
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Quick Install and License Setup
Quick installation and license setup information for MQA 2013.01, Linux.
Installation Manual 2013-03-12 |
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Release Notes
Model Quality Assurance (MQA) 2013.01 product release notes.
Release Notes 2013-03-12 |
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Release Notes
Model Builder Program (MBP) 2013.01 product release notes.
Release Notes 2013-03-12 |
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Quick Installl and License Setup
Quick installation and license setup information for MBP 2013.01, for Windows.
Installation Manual 2013-03-12 |
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
Press Materials 2013-03-12 |
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