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Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR
應用手冊 2013-05-21 |
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Creating Custom Multitone with Agilent U8903A Audio Analyzer - Application Note
This application note discusses how to create custom multitones with the U8903A audio analyzer. Multitones are widely used in modern audio measurements to test consumer and professional audio devices.
應用手冊 2013-05-16 |
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Low Frequency RFID Tag Characterization - Application Note
This application note introduces how to measure the resonance frequency of an RFID tag with the Agilent N9322C basic spectrum analyzer (BSA) easily.
應用手冊 2013-05-16 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
應用手冊 2013-05-10 |
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GNSS Technologies and Receiver Testing - Application Note
This application note provides information on GNSS technologies including GPS, Compass, Beidou, Galileo, and Glonass, along with the related receiver test challenges and solutions.
應用手冊 2013-05-08 |
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Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode
應用手冊 2013-05-07 |
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Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.
應用手冊 2013-05-07 |
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EM Insights Series
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.
應用手冊 2013-05-06 |
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Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.
應用手冊 2013-04-30 |
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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.
應用手冊 2013-04-29 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
應用手冊 2013-04-24 |
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Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test.
應用手冊 2013-04-18 |
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Overvoltage Protection in Power Supplies - Application Note
This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications
應用手冊 2013-04-18 |
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How to Read Your DC Power Supply's Data Sheet - Application Note
Understanding how to sort through key power supply specifications in a data sheet can simplify product selection.
應用手冊 2013-04-16 |
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Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer.
應用手冊 2013-04-16 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
應用手冊 2013-04-12 |
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Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.
應用手冊 2013-04-11 |
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Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers
應用手冊 2013-04-08 |
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PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note
This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis
應用手冊 2013-04-08 |
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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
應用手冊 2013-04-05 |
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Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
應用手冊 2013-04-03 |
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Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.
應用手冊 2013-04-03 |
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Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.
應用手冊 2013-04-02 |
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Oscilloscope Selection Tip 8: Serial Bus Applications - Application Note
Tip 8: Select a scope that can trigger on and decode serial buses to help you debug your designs faster.
應用手冊 2013-04-02 |
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Oscilloscope Selection Tip 3: Acquisition Memory
Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution.
應用手冊 2013-04-02 |
