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Increase Power Amplifier Test Throughput with the Agilent M9381A PXIe Vector Signal Generator An application note with programming instructions on how to accelerate power amplifier test throughput with the fast Agilent M9381A PXIe Vector Signal Generator and achieve cost reductions in test while maintaining high test quality. Application Note 2012-08-29	PDF 799 KB Sprachen English \| 2012-08-29 \| PDF 799 KB 中文（简体） \| 2012-08-29 \| PDF 799 KB 日本語 \| 2013-04-12 \| PDF 2.36 MB 中文（繁體） \| 2012-08-29 \| PDF 799 KB
Increase Power Amplifier Test Throughput with the M9381A PXIe Vector Signal Generator - Overview An overview of how to accelerate power amplifier test throughput with the fast Agilent M9381A PXIe Vector Signal Generator and achieve cost reductions in test while maintaining high test quality. Application Note 2012-08-29	PDF 404 KB Sprachen English \| 2012-08-29 \| PDF 404 KB 日本語 \| 2012-10-16 \| PDF 781 KB
On Characterization of Mechanical Deformation in Flexible Electronic Structures Demonstrates how the Agilent T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates. Application Note 2012-08-28	PDF 634 KB
33500B Series Complex Modular Generation with Low-Cost Arbitrary Waveform Generators - White Paper This white paper illustrates how the Agilent 33500 Series waveform generators with Trueform technology can be applied to generate complex modulated signals. Application Note 2012-08-27	PDF 10.18 MB Sprachen English \| 2012-08-27 \| PDF 10.18 MB 中文（简体） \| 2012-12-01 \| PDF 3 MB 日本語 \| 2012-12-26 \| PDF 2.80 MB
1500 A and 10 kV MOSFET Characterization using the Agilent B1505A-apnote This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs. Application Note 2012-08-27	PDF 722 KB Sprachen English \| 2012-08-27 \| PDF 722 KB 日本語 \| 2013-03-19 \| PDF 1.20 MB
Achieve Measurement Accuracy and Flexibility in Your Microwave Test System Ap Note The application note describes how to enhance measurement accuracy and flexibility in signal analysis by using the M9168C PXI programmable step attenuator module. Application Note 2012-08-24	PDF 294 KB
Simplify the Generation of High-Quality IQ Signals - Application Note Topics include Trueform technology, moving IQ signals from software to a 33500B Series waveform generator for play back, and built-in features for simulating conditions on an IQ signal for testing. Application Note 2012-08-24	PDF 620 KB
S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope. Application Note 2012-08-21	PDF 9.77 MB Sprachen English \| 2012-08-21 \| PDF 9.77 MB 中文（简体） \| 2012-08-21 \| PDF 9.77 MB 한국어 \| 2012-08-21 \| PDF 9.77 MB
Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately? Application Note 2012-08-17	PDF 942 KB
Accelerate Program Development using Agilent Command Expert with Agilent VEE Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with Agilent VEE Pro. Application Note 2012-08-16	PDF 1.41 MB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note The Agilent 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications. Application Note 2012-08-13	PDF 848 KB Sprachen English \| 2012-08-13 \| PDF 848 KB 中文（简体） \| 2009-01-01 \| PDF 541 KB 日本語 \| 2009-11-11 \| PDF 2.41 MB 中文（繁體） \| 2009-01-06 \| PDF 1.05 MB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide Application Note 2012-08-09	PDF 443 KB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity Application Note Application Note 2012-08-02	PDF 470 KB
EXT Wireless Communications Test Set Non-signaling Test Overview This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies Application Note 2012-08-01	PDF 290 KB
IVI-COM driver and VISA-COM I/O programming examples in Microsoft Visual C# - Application Note This application note details the installation instructions and Visual C# programming examples for Agilent Technologies IVI-COM instrument drivers and VISA-COM I/O. Application Note 2012-07-30	PDF 2.37 MB
1500 A and 10 kV IGBT Characterization by using Agilent B1505A-apnote This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications. Application Note 2012-07-27	PDF 654 KB Sprachen English \| 2012-07-27 \| PDF 654 KB 中文（简体） \| 2012-10-20 \| PDF 666 KB 日本語 \| 2012-09-11 \| PDF 1.19 MB
State of the Art in Sub-10ps Pulse Generators: Technology, Performance, and Applications This article will present an overview of sub-10 ps pulse generator architectures, important performance considerations, and conclude with a discussion of key applications. Application Note 2012-07-23	PDF 378 KB
Creating and Optimizing 802.11ac Signals Application Note This application note details how to create and optimize 802.11ac signals using the N7617B Signal Studio for WLAN 802.11a/b/g/n/ac software with Agilent's RF signal generators to get the highest quality signals from the instruments. Application Note 2012-07-19	PDF 2.10 MB
Programmable divider system for 10 Gb/s BERT test system Application Note This application note covers applications, an N4962A block diagram, specifications of data rates, front panel and GPIB operation, and performance data. Application Note 2012-07-18	PDF 135 KB
Application Block Diagrams for 10 Gb/s BERT Test Systems - Application Note This application note discusses seven N4962A applications. Application Note 2012-07-17	PDF 1.69 MB
When it is time to transition to a higher bandwidth oscilloscope? How do we determine how much bandwidth is required for today's projects, and when do we know when it is time to "move up"? Application Note 2012-07-15	PDF 469 KB
Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers Study of the mechanical behavior of polymer fibers Application Note 2012-07-13	PDF 310 KB
Test Instrument General Handling and Maintenance - Application Note Specific handling precautions must be observed for device reliability and optimum performance. Application Note 2012-07-13	PDF 459 KB
Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61) Overview of using Express Test on the G200 nanoindenter to determine the properties of individual phases within a popular magnesium alloy, AZ 61. Application Note 2012-07-13	PDF 155 KB
Module Accessory and Instrument General Handling - Application Note Specific handling precautions must be observed for device reliability and optimum performance. Application Note 2012-07-10	PDF 464 KB

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