Discutez avec un expert

Support technique

Test et mesure électronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

Affiner la liste

retirer tout le raffinement

Par application

Par type de contenu

Par catégorie de produit

151-175 sur 2660

Sort:
Photonics Connector Care: Effects of Damage Connectors and Interfaces in Fiber Optic Measurements
To qualify or predict the effects of damaged fiber optic connectors or optical interfaces, a qualitative assessment can ensure that these connectors are kept in a condition of optimum performance.

Notes d’application 2012-10-14

PDF PDF 2.28 MB
Fully-Automatic DMM Calibration System - White Paper
Describes a fully-automatic calibration system for digtial multimeters (DMMs), including the uncertainty estimation of DC Voltage measurements.

Notes d’application 2012-10-14

PDF PDF 2.28 MB
Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.

Notes d’application 2012-10-14

PDF PDF 1.25 MB
Calibration of Precision Step Attenuators - White Paper
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.

Notes d’application 2012-10-14

PDF PDF 1.38 MB
Understanding Measurement Risk - White Paper
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

Notes d’application 2012-10-09

PDF PDF 749 KB
A Guard-Band Strategy for Managing False-Accept Risk - White Paper
Presents guard-band strategy for managing false-accept risk with only limited knowledge of the a priori probability that a device is in tolerance.

Notes d’application 2012-10-09

PDF PDF 282 KB
U8903A VEE Sample Program for Creating Your Own Notch Filter
Sample programs written in Agilent VEE to help you kickstart your programming in creating your own notch filter for U8903A.

Notes d’application 2012-10-08

ZIP ZIP 427 KB
Reducing Cost of Testing Prototypes with the Agilent Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Agilent Medalist i1000D as a viable option which can help save time and money.

Notes d’application 2012-10-05

PDF PDF 324 KB
Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.

Notes d’application 2012-10-02

PDF PDF 478 KB
Attenuation Measurement of Step Attenuators
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.

Notes d’application 2012-10-02

PDF PDF 440 KB
Constant mode of programmable output resistance function
This application note describes how to use the constant mode of programmable output resistance function featured in B2961A/62A with some application examples.

Notes d’application 2012-10-01

PDF PDF 468 KB
VI emulation mode of programmable output resistance function
This application note describes how to use the VI emulation mode of programmable output resistance function featured in B2961A/62A with some application examples.

Notes d’application 2012-10-01

PDF PDF 800 KB
An Internet-Enabled Primary Impedance Measurement System - White Paper
iPIMMS allows microwave network analyser users to achieve uncertainties which are equivalent to those of measurementsperformed at the National Physical Laboratory (NPI).

Notes d’application 2012-09-26

PDF PDF 440 KB
Virtual Flight Testing of Radar System Performance
Agilent SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Notes d’application 2012-09-21

PDF PDF 633 KB
Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Notes d’application 2012-09-21

PDF PDF 467 KB
Langues 
Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

Notes d’application 2012-09-19

PDF PDF 7.41 MB
Connector Pin Recession and its Effect on Network Analyzer Accuracy
This article outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5-mm connectors.

Notes d’application 2012-09-19

PDF PDF 773 KB
Redirector: Scope Tip of the Month September 2012
http://cp.literature.agilent.com/litweb/pdf/5991-0992EN.pdf

Notes d’application 2012-09-15

PDF PDF 200 KB
Monitoring and Controlling Particle Collisions at Nanometer Scale and with Picosecond Duration
The Large Hadron Collider (LHC) at CERN is the world's most powerful particle accelerator. Agilent digitizers are used to perform wideband beam monitoring and to monitor Forward & Rerverse RF signals.

Notes d’application 2012-09-10

PDF PDF 1.51 MB
FieldFox Microwave Analyzers - White Paper
This white paper describes the features, benefits, and applications of the FieldFox RF & microwave handheld analyzers.

Notes d’application 2012-09-06

PDF PDF 3.35 MB
Evaluating DC-DC Converters and PDN with the E5061B LF-RF Network Analyzer
This application note describes measurement methods for evaluating frequency domain characteristics of DC-DC converters and passive PDN components by using the E5061B LF-RF network analyzer.

Notes d’application 2012-09-03

PDF PDF 5.10 MB
Langues 
U2000 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H)

Notes d’application 2012-09-03

XLS XLS 72 KB
FPGA Prototyping Using Agilent SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Notes d’application 2012-08-30

PDF PDF 3.37 MB
Techniques for Precise Interference Measurements in the Field - Application Note
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Notes d’application 2012-08-30

Techniques for Precise Cable and Antenna Measurements in the Field - Application Note
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Notes d’application 2012-08-30

Précédente 1 2 3 4 5 6 7 8 9 10 ... Page suivante