技术支持
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Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers
应用说明 2013-04-08 |
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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
应用说明 2013-04-05 |
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Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
应用说明 2013-04-03 |
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用于射频和微波测试与测量应用的 USB 同轴开关
用于射频和微波测试与测量应用的 USB 同轴开关
应用说明 2013-04-03 |
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Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.
应用说明 2013-04-03 |
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Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.
应用说明 2013-04-02 |
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Oscilloscope Selection Tip 8: Serial Bus Applications - Application Note
Tip 8: Select a scope that can trigger on and decode serial buses to help you debug your designs faster.
应用说明 2013-04-02 |
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Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.
应用说明 2013-04-01 |
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CAN Eye-diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.
应用说明 2013-04-01 |
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Making Reflection Measurements - Application Note
The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement.
应用说明 2013-03-29 |
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Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.
应用说明 2013-03-28 |
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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.
应用说明 2013-03-27 |
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Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured
应用说明 2013-03-27 |
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Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.
应用说明 2013-03-27 |
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Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note
One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms.
应用说明 2013-03-27 |
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MOI for DisplayPort PHY CTS 1.2b Sink Tests
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.
应用说明 2013-03-21 |
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MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.
应用说明 2013-03-21 |
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Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.
应用说明 2013-03-19 |
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Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.
应用说明 2013-03-14 |
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Making Stimulus/Response Measurements - Application Note
The N9322C basic spectrum analyzer is a dual use RF analyzer, which performs frequency-selective power analysis and component-level characterization when used with the optional tracking generator.
应用说明 2013-03-14 |
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选择高速数字转换器时不能只考虑宣传性的技术指标
选择高速数字转换器时不能只考虑宣传性的技术指标
应用说明 2013-03-13 |
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How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.
应用说明 2013-03-13 |
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In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.
应用说明 2013-03-12 |
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Infiniium Oscilloscopes with 89600B VSA Software - Application Note
This application note describes the characteristics, setup, and operation of an Infiniium Series oscilloscope with 89600 VSA software to provide broadband vector signal analysis.
应用说明 2013-03-08 |
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Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.
应用说明 2013-03-05 |
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