Technical Support

Test & Measurement

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CAN Eye-diagram Mask Testing - Application Note InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards. Application Note 2013-04-01	PDF 2.64 MB
Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system. Application Note 2013-04-01	PDF 476 KB
Making Reflection Measurements - Application Note The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement. Application Note 2013-03-29	PDF 3.40 MB
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer. Application Note 2013-03-28	PDF 8.17 MB
Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms. Application Note 2013-03-27	PDF 1.67 MB
Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured Application Note 2013-03-27	PDF 2.63 MB
Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process. Application Note 2013-03-27	PDF 1.48 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note Agilent's InfiniiVision oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses. Application Note 2013-03-27	PDF 1.28 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document. Application Note 2013-03-21	PDF 7.99 MB
MOI for DisplayPort PHY CTS 1.2b Source Testing This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document. Application Note 2013-03-21	PDF 5.63 MB
Techniques for Time Domain Measurements - Application Note This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field. Application Note 2013-03-19	PDF 919 KB
Making Stimulus/Response Measurements - Application Note The N9322C basic spectrum analyzer is a dual use RF analyzer, which performs frequency-selective power analysis and component-level characterization when used with the optional tracking generator. Application Note 2013-03-14	PDF 3.88 MB
Three Compelling Reasons for Deep Acquisition Memory This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate. Application Note 2013-03-14	PDF 1.71 MB
How Much Indentation Testing is enough testing? - Application Note Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level. Application Note 2013-03-13	PDF 220 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy. Application Note 2013-03-12	PDF 186 KB
Infiniium Oscilloscopes with 89600B VSA Software - Application Note This application note describes the characteristics, setup, and operation of an Infiniium Series oscilloscope with 89600 VSA software to provide broadband vector signal analysis. Application Note 2013-03-08	PDF 5.56 MB
Evaluating Oscilloscope Fundamentals - Application Note We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics. Application Note 2013-03-06	PDF 1.41 MB Languages English \| 2013-03-06 \| PDF 1.41 MB 中文（简体） \| 2008-04-25 \| PDF 717 KB 日本語 \| 2008-05-19 \| PDF 3.24 MB 中文（繁體） \| 2008-12-31 \| PDF 3.31 MB
Techniques for Time Domain Measurements - Application Note This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field. Application Note 2013-03-05
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene Application Note 2013-03-04	PDF 738 KB
DVB-T and DVB-T2 Transmitter Test Challenges - Application Note This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of transmitters for these systems. Application Note 2013-02-27	PDF 986 KB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis Application Note 2013-02-21	PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters. Application Note 2013-02-19	PDF 563 KB
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2013-02-18	PDF 1.29 MB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2013-02-14	PDF 1.76 MB Languages English \| 2013-02-14 \| PDF 1.76 MB 日本語 \| 2013-02-14 \| PDF 1.76 MB
Pulse Parameter Definitions - Application Note Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A Application Note 2013-02-14	PDF 793 KB

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