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Calibration and Specification Considerations When Using Modular Instrumentation - Application Note
Modular instruments such as PXI and AXIe offer significant configuration flexibility, interchangeability, speed, and size advantages but also present unique calibration challenges. This paper examines these issues in detail and considers both in situ calibration and calibration performed outside the use environment.

Application Note 2013-11-01

PDF PDF 312 KB
Determining Critical Stresses in Semiconductors: Using ZnO Crystal & GaN Freestanding Film
A study of the nanoindenter G200 used to perform spherical nanoindentation experiments on ZnO single crystal and GaN freestanding film.

Application Note 2013-10-30

PDF PDF 363 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Application Note 2013-10-29

PDF PDF 380 KB
Accelerate Development of Next Generation 802.11ac Wireless LAN Transmitters-Overview – App Brief
This application note overview describes how to accelerate the development of next generation 802.11ac wireless LAN transmitters.

Application Note 2013-10-29

FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Application Note 2013-10-29

PDF PDF 141 KB
Considerations in Making Small Signal Measurements - Application Brief
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

Application Note 2013-10-29

PDF PDF 841 KB
Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2013-10-28

Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2013-10-26

PDF PDF 331 KB
Multi-Channel Audio Test using the Agilent U8903A Audio Analyzer - Application Note
Learn to use the U8903A audio analyzer, together with a 34970A/34972A data acquisition (DAQ) switch unit and a 34904A 4x8 switch matrix plug in module to increase your overall production needs.

Application Note 2013-10-25

Beam Lead Attachment Methods - Application Note
This application note gives the first time user a general description of various attachment methods for beam lead devices.

Application Note 2013-10-25

PDF PDF 437 KB
High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 520 KB
Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Application Note 2013-10-23

PDF PDF 141 KB
GaAs MMIC ESD, Die Attach and Bonding Guidelines - Application Note
This application note contains information on die attach methods and bonding methods for integrated circuits.

Application Note 2013-10-22

PDF PDF 317 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 128 KB
Testing WLAN Devices According to the 802.11x Standards - Application Note
This application note provides a survey of transmitter/receiver test requirements for 802.11a, b, g, n, ac. It also presents an overview of Agilent’s solutions for WLAN testing.

Application Note 2013-10-21

Using Oscilloscopes to Test and Debug Analog HDTV Signals - Application Brief
Agilent’s InfiniiVision 4000 X-Series oscilloscopes with DSOX4VID option provide trigger and display features ideal for debugging and characterizing analog HDTV signals.

Application Note 2013-10-21

PDF PDF 349 KB
Releasing the “Test Sequence” and “Test” to Production on the Agilent x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Agilent x1149 Boundary Scan Analyzer.

Application Note 2013-10-18

PDF PDF 523 KB
Mapping the Mechanical Properties of Cement-based Materials Using CSM &Ultra-fast Nanoindentation
Study of hydration mechanisms of a commercial cement paste that has been h investigated with the use of the G200 using innovative statistical ultra-fast nanoindentation.

Application Note 2013-10-15

PDF PDF 930 KB
Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

PDF PDF 1.91 MB
CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2013-10-10

PDF PDF 2.61 MB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2013-10-09

PDF PDF 214 KB
Easily Create Custom Waveforms with Waveform Creator - Application Note
This application note provides instructions for how to create custom waveform plug-ins using the M9099 Waveform Creator application software

Application Note 2013-10-01

PDF PDF 593 KB
Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter
Case study of the changes in elastic modulus and hardness of thin film as measured using the nanoindenter and the continuous stiffness measurement option, which measures the mechanical properties as a continuous function of depth.

Application Note 2013-09-30

PDF PDF 469 KB
GaN Current Collapse Effect Evaluation Using the B1505A – Application Brief
This document outlines how the B1505A with the N1267A High Voltage Source Monitor Unit/High Current Source Monitor Unit Fast Switch can be used to solve GaN current collapse measurement challenges.

Application Note 2013-09-30

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