Technical Support: Test y Medida

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LED Production Test Using the Agilent B2911A This technical overview describes LED production test using the B2900A series precision source/measure unit. Application Note 2013-01-07	PDF 1.69 MB Languages English \| 2013-01-07 \| PDF 1.69 MB 日本語 \| 2011-10-27 \| PDF 626 KB
LED IV Measurement Using the Agilent B2911A This technical overview describes the use of LED IV measurements using the B2900 Series Precision source/measure unit. Application Note 2013-01-07	PDF 1.72 MB Languages English \| 2013-01-07 \| PDF 1.72 MB 日本語 \| 2011-10-27 \| PDF 678 KB 中文（繁體） \| 2011-07-11 \| PDF 836 KB
Thermistor Evaluation Using the Agilent B2911A This application introduces features of B2900A Series as the best solution for accurate characterization of thermistor and other two terminal devices. Application Note 2013-01-07	PDF 1.80 MB Languages English \| 2013-01-07 \| PDF 1.80 MB 日本語 \| 2011-10-27 \| PDF 702 KB 中文（繁體） \| 2012-01-10 \| PDF 2.84 MB
LIV Test of Laser Diode Using the Agilent B2912A This application introduces features of B2900A Series as the best solution for LIV test of laser diode. Application Note 2013-01-07	PDF 1.76 MB Languages English \| 2013-01-07 \| PDF 1.76 MB 日本語 \| 2011-04-14 \| PDF 901 KB 中文（繁體） \| 2012-01-11 \| PDF 1023 KB
Thermistor Production Test Using the Agilent B2911A This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test. Application Note 2013-01-07	PDF 1.33 MB Languages English \| 2013-01-07 \| PDF 1.33 MB 日本語 \| 2011-10-27 \| PDF 652 KB
Characterization of Field Effect Transistors Using the Agilent B2912A The Agilent B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software. Application Note 2013-01-07	PDF 1.79 MB Languages English \| 2013-01-07 \| PDF 1.79 MB 日本語 \| 2011-04-11 \| PDF 1.13 MB 中文（繁體） \| 2012-01-04 \| PDF 912 KB
IV Characterizations of Solar/Photovoltaic Cells Using the Agilent B2911A The Agilent B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software. Application Note 2013-01-07	PDF 1.17 MB Languages English \| 2013-01-07 \| PDF 1.17 MB 中文（繁體） \| 2011-07-11 \| PDF 784 KB
Resistor Production Test Using the Agilent B2911A This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test. Application Note 2013-01-07	PDF 1.29 MB Languages English \| 2013-01-07 \| PDF 1.29 MB 日本語 \| 2011-10-27 \| PDF 629 KB
Rapid Hardness of Nano-Structured Metals - Application Note A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed. Application Note 2013-01-03	PDF 174 KB
34980A Measurements Made Easy This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software. Application Note 2012-12-26	PDF 1.26 MB
Calibration of Time Base Oscillators - White Paper As more accurate clocks were produced, new uses of time measurement were explored. As new uses were discovered, the need for even more accurate clocks became apparent. Application Note 2012-12-21	PDF 438 KB
Crystal Oscillator Testing - White Paper A policy concerning the testing of the reference oscillators contained within many instruments has been defined and adopted in Agilent's service centers worldwide. Application Note 2012-12-21	PDF 1.41 MB
Specifications Guidelines - White Paper Agilent Technologies has definitions for its Test & Measurement product specifications and how they are presented. The following material is extracted from these manufacturing recommendations. Application Note 2012-12-21	PDF 1.80 MB
Accelerate FPGA Debug using High Bandwidth Mixed Signal Oscilloscopes - Application Note This application note discusses both digital and analog debug of state-of-the-art FPGAs using a high bandwidth mixed signal oscilloscope. Application Note 2012-12-20	PDF 2.36 MB
Exploring Signal Interactions with Multi-Measurements in the 89600 VSA Software This application note describes how to make multiple measurements simultaneously using 89600 VSA software with one or more measurement front ends. Application Note 2012-12-20	PDF 2.64 MB
Solutions for Wideband Radar and Satcom Measurements - Application Note This application brief talks about using wide bandwidth oscilloscopes to directly measure and analyze X, Ku, and Ka-band Radar and Satcom transmitter outputs up to 62 GHz. Application Note 2012-12-19	PDF 522 KB Languages English \| 2012-12-19 \| PDF 522 KB 日本語 \| 2013-02-19 \| PDF 1.41 MB Pусский \| 2011-10-16 \| PDF 363 KB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-12-17	PDF 1.82 MB
Agilent Frequency Counter Programming Comparison Guide SCPI Programming comparison guide for the Agilent 53200 Series (53210A, 53220A, 53230A) and 531xxA Series (53131A, 53132A, 53181A) RF and Universal Frequency Counter/Timers. Application Note 2012-12-17	PDF 272 KB Languages English \| 2012-12-17 \| PDF 272 KB 日本語 \| 2011-06-09 \| PDF 900 KB
DDR Memory Overview, Development Cycle, and Challenges - Technical Overview Thanks to improved manufacturing processes that have driven down costs, the technology of choice is now DDR SDRAM, short for Double Data Rate Synchronous Dynamic Random Access Memory. Application Note 2012-12-14	PDF 1.37 MB
Creating and Analyzing Custom OFDM Waveforms for Software-Defined Radio (SDR) This note outlines the complexities of generating and analyzing COTS and custom waveforms, proposes solutions that address those problems, and presents the results of the suggested approaches. Application Note 2012-12-14	PDF 483 KB
Selecting a Calibration Vendor - White Paper Cost is important but are there any other questions that need to be asked in selecting a calibration supplier? Application Note 2012-12-11	PDF 1.38 MB
Using a Manufacturer's Specification as a Type B Error Contribution - White Paper Examines the implications of using a manufacturer's specification in an uncertainty analysis; and how calibration laboratories use uncertainty data in their quality systems and customer-facing documents. Application Note 2012-12-10	PDF 1.13 MB
Tips for Making Low Current Measurements with an Oscilloscope and Current Probe An oscilloscope and a clamp-on current probe provide an easy way to make current measurements without necessarily breaking the circuit. Application Note 2012-12-10	PDF 1.64 MB
Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed. Application Note 2012-12-07	PDF 2.28 MB Languages English \| 2012-12-07 \| PDF 2.28 MB 中文（简体） \| 2000-08-01 \| PDF 167 KB 日本語 \| PDF
Accurate Absolute and Relative Power Measurements Using the N5531S - Application Note Application Note 2012-12-04	PDF 7.76 MB Languages English \| 2012-12-04 \| PDF 7.76 MB 日本語 \| 2008-07-17 \| PDF 7.88 MB

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