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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
内部通讯 2013-05-14 |
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教育计划电子期刊――2008 年 6月第 2 期
教育计划电子期刊――2008 年 6月第 2 期
内部通讯 2013-05-07 |
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Electronic Manufacturing Test Support eNews - April 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support
内部通讯 2013-04-25 |
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Ensuring The Highest Quality Microwave Measurements - Article
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.
文章 2013-04-22 |
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Agilent’s FieldFox Analyzers: Redefining RF Education
专访 2013-04-22 |
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Students “Learn by Doing” at Cal Poly
专访 2013-04-22 |
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ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.
期刊 2013-04-02 |
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Incremental Redundancy in EGPRS
Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF.
文章 2013-04-02 |
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Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.
文章 2013-04-01 |
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Software, Connectivity Solutions
文章 2013-03-21 |
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Optimize Time Gating in Spectrum Analysis
Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.
文章 2013-03-20 |
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Turn Your Agilent Handheld Meter into a Data Logger - Case Study
Case study on how to turn Agilent Handheld Meter with U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC into a Data Logger keywords: U1177A Bluetooth Adapter, Agilent Wireless Remote Connectivity Solution, bluetooth adapter, Handheld DMM, data logger
案例分析 2013-03-11 |
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898 KB
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White Paper : Current Activity in 5G
A white paper offering background on what is currently happening in the world of 5G —significant developments and major players.
文章 2013-03-05 |
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Automating Communications Measurement - Article
This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software.
文章 2013-02-07 |
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雷达系统的数字基带和射频域集成挑战
Reconfigurable radar systems employ digital technology in the form of FPGAs and DSPs.That digital technology is combined with RF technology to achieve a high level of flexibility.
文章 2013-01-31 |
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1.34 MB
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Artificial Retina Research at the University of Utah Provides Hope for the Blind
专访 2013-01-31 |
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Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.
文章 2013-01-31 |
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雷达、电子战和电子情报测试:确定共同的测试挑战
This article in Defense Technical Briefs covers common test challenges and radar basics. Radar, EW, and ELINT engineers make a variety of routine measurements. As highlighted earlier, pulse width and PRF or PRI provide important information about a radar system’s resolution and range.
文章 2013-01-31 |
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532 KB
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Electronic Manufacturing Test Support eNews - February 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support
内部通讯 2013-01-31 |
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Asahi Kaesei Microdevices Corporation Develops High-End, Low-Noise Process
AKM to develop the highest low-noise process by using Agilent's state of the art 1/f noise measurement system.
案例分析 2013-01-09 |
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Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.
文章 2013-01-09 |
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安捷伦教育领域新闻
安捷伦教育领域新闻
专访 2012-12-10 |
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Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification
With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection.
专访 2012-12-06 |
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105 KB
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Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article
This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized.
文章 2012-12-01 |
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386 KB
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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA
文章 2012-11-30 |
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