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Factory Test Technology License (FTTL) from Qualcomm
This FTTL License from Qualcomm granted Agilent a worldwide license to demonstrate and distribute products that leverage the Qualcomm technology for RF factory testing.

Article 2012-09-06

The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

Article 2012-08-24

PDF PDF 1.04 MB
Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.

Article 2012-08-24

PDF PDF 191 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

Article 2012-08-24

PDF PDF 294 KB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

Article 2012-08-24

PDF PDF 206 KB
Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

Article 2012-08-24

PDF PDF 235 KB
Optimize Signal/Spectrum Analyzer Throughput for High-Volume Manufacturing Test
The Microwaves & RF article discusses how to obtain the highest throughput for the analyzers used in manufacturing test by creating a test plan that accounts for speed, repeatability, and dynamic range.

Article 2012-08-20

Design, simulation and measurement automation
Link to Electronic Products and Technology article discussing the marrying of both electronic design automation (EDA) tools and processes with measurement for system level design and verification.

Article 2012-08-10

Electronic Manufacturing Test Support eNews - July 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2012-07-31

Comparing In-house and Commercial Load Solutions for Automotive Test

Article 2012-07-17

NASA Tech Brief Article: Software Defined Instruments Address Mixed-Signal Test Challenges of Today
Software Defined Instruments Address Mixed-Signal Test Challenges of Today.

Feature Story 2012-07-13

Microwave Product Digest article: New Techniques Simplify Military Frequency-Converter Characteriza
Covers the transmit and receive chains of all defense systems, ranging from EW, ECM, ESM, ELINT, and SIGINT receivers, to satellite terminals and transponders, and radar systems

Article 2012-07-13

Testing Radar and EW Systems for the Real-World
The solutions described in this Microwave Journal article do more than address a wide range of present and future radar systems: They also help overcome organizational hurdles.

Article 2012-07-12

Techniques for Time Sidelobe Measurements with Pulse Compression Radar
provides enhanced spatial resolution as well as an extended range for a given output power level.

Article 2012-06-14

Product How To: Design a polar frequency discriminator
Polar frequency discriminators (PFD) are widely used in radar and direction-finding applications to determine the unknown frequency of incoming pulses. This article explains how to design the RF portion of a PFD, over a frequency range of 2 to 8 GHz, using Agilent’s ADS software.

Article 2012-06-08

Simplify Military Frequency-Converter Characterization
covers two essential measurements required to characterize converters, port match and transmission response characteristics.

Article 2012-06-07

How to design a high-performance scope: One team’s approach
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

Article 2012-06-07

Sorting Through EM Simulators
Matching an electromagnetic simulator to a particular application requires an understanding of the different simulation technologies at the heart of these software tools.

Article 2012-05-25

PDF PDF 3.50 MB
MIMO Over-The-Air Research, Development, and Testing
International Journal of Antennas and Propagation, May 2012 article provides information on the many challenges of identifying the optimal channel models and test method(s), for MIMO

Article 2012-05-09

Electronic Manufacturing Test Support eNews - April 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2012-04-30

Impedance Measurement With E5061B LF-RF Network Analyzer Slides
This presentation material describes fundamentals, calibrations, and application examples of the impedance measurement using the E5061B-3L5 LF-RF network analyzer.

Article 2012-04-22

PDF PDF 5.38 MB
Testing DDR Memory; How On-Chip DFT Helps
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

Article 2012-04-17

PDF PDF 530 KB
Boundary-Scan Advanced Diagnostic Methods
This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.

Article 2012-04-17

PDF PDF 1.20 MB
Two-Stage Over-the-Air (OTA) Test Method for LTE MIMO Device Performance Evaluation
International Journal of Antennas and Propagation, February, 2012, article introduces a novel, flexible, and cost-effective method for measuring MIMO OTA using a two-stage approach.

Article 2012-03-28

Addressable Test Structures for MOSFET Variability Analysis
This IEEE paper presents a 4-bit addressable array-based test structure with a centre reference transistor allowing evaluation of variability in advanced technologies.

Article 2012-03-19

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