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Faculty Spotlight Articles Interesting news on universities that are using Agilent equipment to do unique and exciting things. Article 2013-05-20
Dayalbagh University in India develops ON-DEMAND Remote Laboratories Feature Story 2013-05-20
Agilent EEsof EDA Newsletter - Product and Application News Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter. Newsletter 2013-05-14
Education Program Newsletter - Vol 2. June 2008 Education Program Newsletter - Vol 2. June 2008 Newsletter 2013-05-07
Electronic Manufacturing Test Support eNews - April 2013 Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support Newsletter 2013-04-25
Students “Learn by Doing” at Cal Poly Feature Story 2013-04-22
Ensuring The Highest Quality Microwave Measurements - Article High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article. Article 2013-04-22
Agilent’s FieldFox Analyzers: Redefining RF Education Feature Story 2013-04-22
ESL Design Notebook Blog The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense. Journal 2013-04-02
Incremental Redundancy in EGPRS Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF. Article 2013-04-02
Enabling Simulation and Test of Custom OFDM Signals Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness. Article 2013-04-01
Software, Connectivity Solutions Article 2013-03-21
Optimize Time Gating in Spectrum Analysis Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals. Article 2013-03-20
Turn Your Agilent Handheld Meter into a Data Logger - Case Study Case study on how to turn Agilent Handheld Meter with U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC into a Data Logger keywords: U1177A Bluetooth Adapter, Agilent Wireless Remote Connectivity Solution, bluetooth adapter, Handheld DMM, data logger Case Study 2013-03-11	PDF 898 KB
White Paper : Current Activity in 5G A white paper offering background on what is currently happening in the world of 5G —significant developments and major players. Article 2013-03-05
Automating Communications Measurement - Article This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software. Article 2013-02-07
Designing Multiple-Throw Switches in a MMIC Configuration A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies. Article 2013-01-31
Artificial Retina Research at the University of Utah Provides Hope for the Blind Feature Story 2013-01-31
Electronic Manufacturing Test Support eNews - February 2013 Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support Newsletter 2013-01-31
Asahi Kaesei Microdevices Corporation Develops High-End, Low-Noise Process AKM to develop the highest low-noise process by using Agilent's state of the art 1/f noise measurement system. Case Study 2013-01-09
Agilent embraces GaN modeling in IC-CAP upgrade EETimes Design Article highlights new capabilities in IC-CAP 2013.01. Article 2013-01-09
Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection. Feature Story 2012-12-06	PDF 105 KB
Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized. Article 2012-12-01	PDF 386 KB
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA Article 2012-11-30
Future Device Modeling Trends Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream. Article 2012-11-28	PDF 6.08 MB

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