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101-125 / 735
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Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.
기사 2011-06-02 |
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1.04 MB
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Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine
기사 2011-05-02 |
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The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.
기사 2011-04-24 |
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1.61 MB
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Multichannel scopes enable MIMO RF testing
This article discusses troubleshooting techniques with time-coherent multichannel scopes and 89600 VSA software to gain insight into error mechanisms affecting their hardware EVM performance and system-level RF transmitter performance budgets.
기사 2011-04-12 |
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EE Times: Time-domain simulations of high-speed links with X parameters
기사 2011-03-29 |
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The CTIA Wireless 2011 MIMO OTA Expert Forum
The ever increasing spectrum efficiency requirements of MIMO mobile devices in 4G networks challenge designers to implement multiple antennas into small form factor.
기사 2011-03-24 |
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In-circuit test – Still standing strong
Nay-sayers who about a decade ago started doubting the viability of in-circuit test should look at the thriving sub-ecosystem that is supporting this manufacturing test stalwart.
기사 2011-03-11 |
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294 KB
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Tackling the Mixed-signal Testing Challenges of SDR
Software-defined radios (SDR) utilize a combination of FPGAs, DSPs and analog/RF designs to achieve the radio’s system performance.
기사 2011-03-09 |
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Don't worry, be happy: Design, test, verification support for LTE-Advanced is here
Link to Agilent product review in the February 2011 EETimes.
기사 2011-02-14 |
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In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Agilent N5747A high-power power supply on a customer product - a networking board project.
사례연구 2011-02-11 |
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1.12 MB
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Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.
기사 2011-01-13 |
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966 KB
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Programming In-System versus Offline-Article Reprint
Is offline programming or ISP at in-circuit test better? One key consideration is the cost of each method. This paper looks at pros and cons of these two methods contributing to the overall costing.
기사 2011-01-13 |
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159 KB
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EE Times & Agilent Blog: The changing face of electronic test instrumentation
The changing face of electronic test instrumentation.
기사 2011-01-12 |
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Education Program Newsletter - Vol 3. September 2008
Education Program Newsletter - Vol 3. September 2008
뉴스레터 2011-01-12 |
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Wideband Radar + SATCOM Measurements
Growing trends in SATCOM and radar systems in the A/D market.
특집 기사 2011-01-12 |
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Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.
기사 2011-01-11 |
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An Innovative and Integrated Approach to III-V Circuit Design
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis
기사 2011-01-10 |
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360 KB
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GPETE Blog
Find hints and tips, industry trends, and new product announcements pertaining to the top five most commonly used test and measurement instruments.
특집 기사 2010-12-16 |
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Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE
기사 2010-12-10 |
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1.10 MB
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Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE
기사 2010-12-10 |
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402 KB
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Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.
기사 2010-12-10 |
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789 KB
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Frost & Sullivan Movers and Shakers Interview with Larry Desjardin
Published with kind permission of Frost & Sullivan
기사 2010-12-03 |
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521 KB
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The LXI System You Didn’t Know You Were Using
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.
기사 2010-11-10 |
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LXI Instrumentation applied to bioanalytical electrical characterization
기사 2010-11-09 |
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The Proposed IEEE Test Standards
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend
기사 2010-10-20 |
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2.83 MB
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