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ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

Article 2012-02-28

EE Times Design article: Options for simulating wideband signals

Article 2012-02-23

Using Software Defined Instruments to Address the Mixed-Signal Test Challenges of Today’s Software
Link to a NASA Tech Brief article which states to ensure successful operation of SDR designs requires use of modern instruments capable of bridging the digital-analog divide, while also addressing any challenges stemming from use of the SDR technology itself

Article 2012-02-01

Electronic Manufacturing Test Support eNews - January 2012
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2012-01-31

Practical Digital Wireless Signals
Learn the intricacies and tradeoffs in signal selection and design with this practical guide book from Earl McCune.

Journal 2011-12-06

Defining the 4G PHY Architecture Design Challenges
EE Times design article (Part 1) on defining the 4G PHY architecture design challenges.

Journal 2011-12-05

Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.

Journal 2011-12-04

Article: Case study - Threat simulation for multi-port radar and electronic warfare systems
Case Study

Case Study 2011-11-30

High-Speed Data Throughput Test
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

Feature Story 2011-11-29

802.11ac Wireless LAN: what’s new and the impact on design and test
EE times article by Agilent’s Mirin Lew describing the 802.11ac, the technical challenges and comparisons to earlier technologies.

Article 2011-11-09

Microwaves & RF article: Enhancing Analysis Of Spurious Emissions
Enhancing analysis of spurious emissions shows that understanding the test instrument and measured signal can impact speed and accuracy.

Article 2011-11-07

Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.

Article 2011-11-04

PDF PDF 338 KB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

Article 2011-11-04

PDF PDF 67 KB
Defect Coverage of Boundary-Scan Tests - Article Reprint
This paper discusses the potential and challenges with some defects when using the "PCOLA/SOQ" metric model in boundary scan test coverage.

Article 2011-11-04

PDF PDF 245 KB
Test Coverage: What Does It Mean when a Board Test Passes? - Article Reprint
Defining board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage. This paper explores an alternative 'defect universe' to better depict test coverage.

Article 2011-10-27

PDF PDF 89 KB
A New Probing Technique for High-Speed/High-Density Printed Circuit Boards - Article Reprint
This paper discusses how in-circuit test access can be maintained, even on highly dense gigabit logic boards.

Article 2011-10-24

PDF PDF 341 KB
J-BERT High - Performance Serial BERT product awards
J-BERT High - Performance Serial BERT product awards

Case Study 2011-09-13

LTE-Advanced…Already?
Article reprint from OSP magazine detailing the additional changes LTE-Advanced brings to the Network already working to implement 3GPP LTE.

Article 2011-09-01

PDF PDF 695 KB
N6841A and N6854A Blog

Feature Story 2011-08-22

LED Measurement Options at ICT - Article Reprint
This paper reviews current methods and constraints of LED color testing methodologies.

Article 2011-08-08

PDF PDF 306 KB
A Primer on Test Options - Article Reprint
This paper discusses why ICT remains the best option for high-volume electronics manufacturing, with its flexibility to provide a myriad of test options to meet different manufacturing needs.

Article 2011-08-08

PDF PDF 269 KB
Successful ICT Boundary Scan Implementation - Article Reprint
This paper details eight steps which can help you get the best possible boundary scan test coverage with your i3070 in-circuit tester.

Article 2011-08-08

PDF PDF 111 KB
ICT Boundary Scan Development Steps - Article Reprint
This paper discusses how test point access and good data can make a big difference in the success of your boundary scan test. Best practises for boundary scan test development are also highlighted.

Article 2011-08-08

PDF PDF 411 KB
Ultra-wideband radar system design article in EE Times

Feature Story 2011-07-27

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

PDF PDF 585 KB

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